ThermoFisher Scientific ( former FEI and DCG System products), is the leading provider of faults localisation, diagnostic debug and characterization solutions for the global semiconductor industry
Fault Localization with lockin thermography: Elite Lite, Elite, Elite + OBIRCh
Fault Localization with Emission Microscopy and Laser Scanning Microscopy: Meridian S, Meridian IV, Meridian VII , Waferscan
Design Debug: SLS/DLS, LVx Option: LVI, LVP, Phase LVI , LVT
Design Debug with Ebeam: Meridian EX
NanoProbing: nProber IV , Hyperion II
Sofware: NEXS software suite
Varioscale is the leader in scalable laser micromachining and novel metrology solutions.
Metrology: VarioMetric, VarioProfile
SiliconAccess – micro-machining: VarioMill
SEIWA Optical is a leading provider of optical solutions for FA lab semiconductor equipments, machine vision, optical microscope
Optics & Imaging : Lenses, special IR lenses, IR Microscope & Camera
Teseda’s testers allow its customers to speed silicon debug, manufacturing ramp, failure analysis, and yield learning.
Testers: V550 DI Lab System, and software suite TWB & Diagnostic suite: Defect Isolator , Broken Scan Chain, Curve Tracer
Nisene is the world leader in automated decapsulator technology and plastic etching
Package Opening/ Decapsulation with the JetEtch Pro Family : Copper Protect, Total Protect;
Plasma decapsulation with the PlasmaEtch
AEM ( former MuTest) offers a wide range of mixed signal ATE testers to address the Cost Of Test (COT) challenges faced by all the IC Semiconductor Companies.
Tester: M5S & M5S-HD (Structures)
Can be populated with a wide range of instruments : 256 channels digital , mixed signal , VI, DPS
Insight offers systems in the field of non-destructive evaluation technology (NDE). In particular, Insight specialized on non-destructive analysis using Ultrasound technology: Scanning Acoustic Microscope.
Predictive Image, a non destructive analysis and diagnostic consultancy and services in the field of Acoustic Microscopy.