Providing Effective Solutions …
Providing Effective Solutions …
ThermoFisher Scientific ( former FEI and DCG System products), is the leading provider of faults localisation, diagnostic debug and characterization solutions for the global semiconductor industry
Fault Localization with lockin thermography: Elite Lite, Elite, Elite + OBIRCh
Fault Localization with Emission Microscopy and Laser Scanning Microscopy: Meridian S, Meridian IV, Meridian VII , Waferscan
Design Debug: SLS/DLS, LVx Option: LVI, LVP, Phase LVI , LVT
Design Debug with Ebeam: Meridian EX
NanoProbing: nProber IV , Hyperion II
Sofware: NEXS software suite
Varioscale is the leader in scalable laser micromachining and novel metrology solutions.
Metrology: VarioMetric, VarioProfile
SiliconAccess – micro-machining: VarioMill
SEIWA Optical is a leading provider of optical solutions for FA lab semiconductor equipments, machine vision, optical microscope
Optics & Imaging : Lenses, special IR lenses, IR Microscope & Camera
Teseda’s testers allow its customers to speed silicon debug, manufacturing ramp, failure analysis, and yield learning.
Testers: V550 DI Lab System, and software suite TWB & Diagnostic suite: Defect Isolator , Broken Scan Chain, Curve Tracer
Nisene is the world leader in automated decapsulator technology and plastic etching
Package Opening/ Decapsulation with the JetEtch Pro Family : Copper Protect, Total Protect;
Plasma decapsulation with the PlasmaEtch
IpTest and Focused Test are now both part of Cosmic group.
IpTest designs, manufactures and supports labs equipment to characterize Wide bandgap ( WBG ) devices . The Quasar200 and Pulsar600 Power Characterization Testers make it quick and easy to measure WBG power device performance.
Focused Test designs, manufactures and supports a family of power discrete and analog IC ATE (Automatic Test Equipment). FTI partners with customers to offer targeted solutions that meet analog IC test requirements. Mosfet , GAN , SiC , Power devices . The FTI 1000 family is dedicated to these devices.