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Design Debug
Probing your device for design & timing analysis
Enabling Timing analysis for 7 nm – adapting solution to your technology
Timing analysis enables design debug or failure analysis. Advanced probing requirements are :
Advanced resolution of the probe– to differentiate which gate is being probed
Advanced timing analysis, short raise time, large bandwidth – from just test sequence validation to the most advance rise time analysis
Advanced sensitivity – to adapt to the smallest Vdd
Advanced resolution for imaging & ease of use CAD navigation – to correlate accuratly probing and to the required design location
Laser Voltage Probing ( LVP) technology enables faster timing rise analysis (down to 10ps), lower voltage analysis.
In Addition, LVx option available Meridian family enable extending capability your current system with design debug solution.
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Meridian Family supports full design debug capability with LVx option .
LVI : Laser Voltage Imaging
LVP : Laser Voltage Probing