Top solutions

Testers & EDA tools
Tester for Designers
- Speed up your silicon validation
- Enable new Failure Analysis support
Tester for Performances
- Best Performance for Digital (incl DDR2/DDR3), MixWave Testing
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Localize Fault in Package
Localize Hot Spot
- For package/ power devices/ silicon and more applications


Inspect
- Infrared Superficial Inspection: Seiwa IR-2200 microscope
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EFA (Silicon)
Providing ALL localization solutions for EFA (Electrical Failure Analysis)
Wide range of techniques (EMMI, SLS, DLS, …) for FA lab with Best Performances
Don't Get stuck with Broken Scan Chain - Let's LVx it
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IC decapsulation
Acid and Laser Decapsulation
Get ready and working solution for your copper/silver/complex alloy packages.

Unique and Patented Electrolysis process for copper protection
Reliable laser ablation solution with Decap 10 and Decap 20 products
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