Wide-bandgap (WBG) power devices such as SiC and GaN require a completely different approach to characterization than the previous generation of Si power products. Higher powers, significantly faster switching speeds and a wide range of necessary performance standards such as JESD 24-9, JESD 24-10 and AQG-324, all place new demands on the power analyser.
It has become essential to characterize and test those devices as close as possible to their mission profile.
Core Technologies
As a complete solution for Wide-Bandgap device testing, Cosmic lab systems are built to accelerate how engineers characterize power devices – whether in research, development, or pre-production. From initial setup to high-voltage test execution and result reporting, our platform is comprehensive, precise, and safe. With modular hardware, intuitive software, and UKAS-traceable calibration, Cosmic gives labs the ability to generate real, actionable insight – faster and with fewer variables.
Solutions
The Quasar200 and Pulsar600 Power Characterization Testers make it quick and easy to measure WBG power device performance.
Quasar200 is ideal for Si, GaN and lower power SiC testing. Pulsar600 is our ultimate characterization solution for ultra high current applications, particularly SiC, invertor and automative applications.
The FTI-1000 Flexible is a compact DC characterization platform designed for medium-power Si and GaN devices. Delivering up to 1.2 kV and 100 A of programmable DC stimulus, it enables accurate extraction of static electrical parameters across a broad range of discrete packages..