Overview

Seiwa Optical provides high-performance optical solutions for semiconductor failure analysis, inspection and imaging applications.

Its portfolio includes microscope objectives, infrared (IR) objectives, telecentric lenses, zoom lenses and advanced microscopy systems designed to deliver high resolution and sensitivity for demanding semiconductor applications.

High-performance optics are a critical component of semiconductor failure analysis and fault localization systems. Sector Technologies partners with Seiwa Optical to provide advanced optical solutions designed to improve imaging resolution, sensitivity and inspection capabilities.

A wide range of objective lenses and microscopy solutions is available to address different applications, wavelengths and system configurations, including frontside and backside semiconductor analysis.

Core Technologies

Optical & IR Objectives
High-performance M Plan APO, PE IR and PE IR Hi-Res objectives for visible and infrared semiconductor imaging applications.

Telecentric & Zoom Lenses
Precision optical solutions for inspection, measurement and imaging applications requiring high image quality and controlled magnification.

Microscopy Systems
Advanced microscopy solutions for frontside and backside inspection of semiconductor devices, supporting the analysis of cracks, contamination, lamination defects, electrical discharge damage and other device anomalies.