Fault Localization

MultiSolutions with the highest sensitivity & resolution

Fault isolation solutions are required after electrical test to identify where is physical defect locate.

All electrical failure analysis solution

Thermofisher’ suite of products and solutions can adapt to all your Electrical Failure Analysis needs. Providing most advanced analysis solution on silicon, extending solution on wafers if required, as well as, enabling packaging analysis.

Meridian IV : versatile localization tool with EMMI, SLS/DLS, LVX , SIL lenses

Meridian S : versatile localization tool with EMMI, SLS/DLS, LVX , SIL lenses, probing station

Meridian S datasheet

Elite : lockin thermography for packages, die , wafers. Thermal mapping and 3D localization analysis.

Elite datasheet

Apps Note :Failure Analysis of Wide Bandgap Power Devices

This suite can be completed with:

Meridian Waferscan : semi-automated prober for EMMI, SLS/DLS, LVX analysis, SIL lenses compatible.

Meridian Waferscan Datasheet

Meridian 7 : Laser base optical fault isolation system for non-destructive localization of electrical faults at sub-10 nm nodes.