Power Device Test

High Power Test 

Fast Switching Speed

Turn Key Solution

Operator Safety

Overview

Wide-bandgap (WBG) power devices such as SiC and GaN require a completely different approach to characterization than the previous generation of Si power products. Higher powers, significantly faster switching speeds and a wide range of necessary performance standards such as JESD 24-9, JESD 24-10 and AQG-324, all place new demands on the power analyser.

It has become essential to characterize and test those devices as close as possible to their mission profile.

Core Technologies

As a complete solution for Wide-Bandgap device testing, Cosmic lab systems are built to accelerate how engineers characterize power devices – whether in research, development, or pre-production.
From initial setup to high-voltage test execution and result reporting, our platform is comprehensive, precise, and safe. With modular hardware, intuitive software, and UKAS-traceable calibration, Cosmic gives labs the ability to generate real, actionable insight – faster and with fewer variables.

Solutions

The Quasar200 and Pulsar600 Power Characterization Testers make it quick and easy to measure WBG power device performance. Quasar200 is ideal for Si, GaN and lower power SiC testing. Pulsar600 is our ultimate characterization solution for ultra high current applications, particularly SiC, invertor and automative applications. The FTI-1000 Flexible is a compact DC characterization platform designed for medium-power Si and GaN devices. Delivering up to 1.2 kV and 100 A of programmable DC stimulus, it enables accurate extraction of static electrical parameters across a broad range of discrete packages..

Quasar 200

DC Test : 3000 V , 200A

AC Test : 1200V, 1200A

Integrated software 

Comprehensive Safety for operator

Datasheet

Pulsar 600

DC Test : 3000 V , 600A

AC Test : 1400V, 3000A

Integrated software 

Comprehensive Safety for operator

Datasheet

 

FTI-1000 LAB

DC Test : 1200 V , 100A

Rdson, Idon, Vce(sat), Vgs, Gfs, Igss, Idss

AC Test : Rdson dynamic

Integrated software 

Comprehensive Safety for operator

Datasheet

Power Devices Test applications

Some examples of common test on SIC and GAN devices

2kA type 1 short circuit on a SIC MOSFET

Vds = 600V, Vgs = 13V

Id = 2.02kA

Time = 4µs

3 * TO247-4 in parallel

Breakdown Voltage

BVDSS

1.7kV @ 1mA

VDS @ 100A

 

Multi-pulse reverse recovery test on a SIC MOSFET

Vds = 800V, Vgs = 15V

Rg (on) = 5 Ohm, RG ( Off) = 10 Ohm

Loop = 2

1 * TO247-4 

Multi-pulse CIL test on a SIC MOSFET

Vds = 800V, Vgs = 15V

Rg (on) = 5 Ohm, RG ( Off) = 100 Ohm

Id = 150A

Pulse = 7

1 * TO247-4