Elect. Failure Analysis

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ISTFA 2011

Thermal Frequency Imaging: A new application of Laser Voltage Imaging applied on 40nm technology

G. Celi, S. Dudit, T. Parrassin (ST Microelectronics), P. Perdu (CNES), A. Reverdy (Sector Technologies), Dean Lewis (IMS), M. Vallet (ST Microelectronics)

ESREF 2011

LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis

G. Celi, S. Dudit, T. Parrassin (ST Microelectronics), P. Perdu (CNES), A. Reverdy (Sector Technologies), Dean Lewis (IMS), M. Vallet (ST Microelectronics)

ISTFA 2009

Overview of Laser Voltage Imaging (LVI) solution

(purchase online)

Deyine, A.  Sanchez, K.  Perdu, P.  Bourcier, F.  Battistella, F.  Bereil, F.  Le Nouy, P.  Lewis, D.  Deslandes, H.  THALES, CNES (Centre Nat. d'Etudes Spatiales- French Space Agency) Lab., Toulouse, France

ISTFA 2009

ESREF 2010

"Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45nm and below)" (ST Microelectronics, Sector Technologies, CNES, IMS)

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