Largest samples at highest resolution




The Xradia VersaXRM family is the latest generation of 3D X-ray microscopy (XRM) solutions optimized for non-destructive micro tomography. The VersaXRM-500 advances industry and science with a versatile combination of world-leading resolution and contrast, sample flexibility and the large working distance required to address emerging research challenges. The system's source technology and high resolution detector provide unmatched sub-micron resolution, even for large samples.

For semiconductor - applications are for :

  • failure analysis on package
  • R&D on package (process optimization) & reliability studies
  • In situ measurements and time-dependent (4D) studies - for instance : crack propagation
Key value of Xradia's technology: Ensure critical
resolution accross your sample size

bump-crack Bump crack - unmatched resolution for failure analysis on package


VersaXRM-500 is a Xradia solution 

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