Testers

teseda tester

Teseda's tester

Speed up your debug on silicon, leverage your DFT & enhance your failure analysis, thanks to a tester dedicated to scan chain debug.

Teseda's tester

- HW: V520/ V550 - SW: TWB

- NetXY

MuTest's ATE

ATE performance at low cost of test for complex SOC testing - including digital, mixed signal & memory (DDR2 up to DDR3)

MuTest's ATE

MT5S & MT19S structure

multiple instruments

Focused Test tester

Tester for Power discrete and Analog IC

Specific GAN test option

FTI 1000

FTI 3000

FTI 5000

Failure Analysis

Package Fault Localisation

With new package technologies, new technologies enable efficient electrical fault localisation for package.

DCG System's  Lock-in Thermography

ELITE

TERAVIEW's TeraHertz TDR

EOTPR

Zeiss 3D tomography

Solutions for non destructive fault identification in package


Zeiss's X-Ray Solution

Xradia 410 Versa

Xradia 510 Versa

Xradia 520 Versa

 

Silicon Fault Localization

Yield improvement solutions employing emission-based analysis, Dynamic Fault Imaging and Static Fault Imaging for both packaged parts and wafers

Meridian IV/V/7

Meridian M

Waferscan / DP

Elite

LVx option

Circuit Edit

Solutions for circuit modification down to 10nm technology

Optifib Taipan

 

 

Design Debug

Solutions for non-contact probing of integrated circuits.

 

LVx option

NanoProbing

Transistor probing for electrical characterization for process integration and failure analysis.

SEM probing solution

Atomic Force Probing solution

nProber III

Flexprober

Hyperion

 

CAD Analysis software

Solutions for correlation to design analysis – from all Fault isolation, Circuit Edit & Design debug solutions

NEXS

Sample Preparation and Laboratory Equipement

Decapsulation & Delayering

Chimical and Plasma decapsulation

Nisene's JetEtch
Nisene's PlasmaEtch

Metrology

Solutions for sample preparation and MEMS characterization

VarioMetric

VarioProfile

Silicon access – LACE

Solutions for clean & fast silicon/ glass opening (prio FIB, etc…)

Ultra-thinning Silicon preparation - VarioMill

Backside preparation down to 2µm for advanced SIL

VarioEdit

VarioMill

Optical & Images

Solutions to enhance of your optical plateforms & bench.

Seiwa Optical

  • Lenses

  • IR2000 optical microscope

  • Machine vision



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