Metrology

Enabling metrology through Silicon & Glass

 

 

 

Thickness & Profile control solution for your Silicon preparation

Regardless of your lab activities, quality of Silicon access from the sample is key, metrology solution enables control of your Silicon – glass device.

Near InfraRed spectroscopy enable through Silicon/ Glass Thickness measurements, as well as multilayer thickness analysis. Completing the solution with a stage & control solution enables you to profile measurement.

 



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