ir-lenses

 

Near IR Lenses for Photo emission application

PE IR Plan APO series 2.5x/ 20/50X/100X

 

 

 

 

PE IR APO lenses focus on a specific range of 800nm - 1600nm with long working distance with high resolution. PE IR Plan APO is precisely color-corrected with 0 focal shift between these two wavelengths.

Available in a 2.5X, 20X, 50X and 100X maginifications to suit all your needs.

Full catalogue available : please contact us.

Note: LCD and Silicon Corrected lens also available.

Some Specifications

Model#
PE IR PlanAPO 2.5X
PE IR PlanAPO 20X
PE IR PlanAPO 50X
PE IR Plan APO 100X
Magnification
2.5X
20X
50X
100x
Working Distance
30mm
12mm
10mm
10mm
Focal length
80mm
10mm
4mm
2.0mm
N.A
0.1
0.5
0.6
0.75
Resolution
3.3μm
0.6μm
0.5μm

Depth of focus
27.5μm
1.1μm
0.7μm

Wave length
800-1600nm
900nm - 1500nm
Transmission
80%<(400-1800nm)
70%<(540nm)
70%<(1300nm)
70%<(540nm)
70%<(1300nm)
80%< (1,000nm -1,500nm)
Glass correction
-
-/1.0mm(LCD)
-/1.0mm(LCD)
Weight
300g
424g
493g

 


microscope

Seiwa IR-2200 : NIR/ SWIR

Seiwa IR-2200 system integrates an infrared table-top microscope with a high quality optics, powerful software and 4.1 Megapixel USB-3.0 NIR InGaAs or CMOS camera.

Seiwa IR-2200 system is capable of:

 

  • high precision measurements
  • image capture and videos
  • verification and inspection of materials transparent to the near infrared (NIR) / Shortwave Infrared (SWIR) wavelengths.

 

 

Seiwa IR-2200 enables FA / Q&R engineers to inspect sub-surface images including:

 

  • 3D stacks
  • MEMS devices
  • incoming wafers
  • photovoltaic
  • wafer level Chip Scale Packages

 

A wide choice of high quality SEIWA objectives is available upon customer’s need.


These products are SEIWA Optical's solutions seiwa



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