Fault Localization

MultiSolutions with the highest sensitivity & resolution

 

Fault isolation solutions are required after electrical test to identify where is physical defect locate.

All electrical failure analysis solution

DCG Systems' suite of solutions can adapt to all your Electrical Failure Analysis needs. Providing most advanced analysis solution on silicon, extending solution on wafers if required, as well as, enabling packaging analysis.

 

meridian trivision
waferscan This suite can be completed with:
LVx
NEXS

Application for Electrical Failure Analysis - Fault Localization on Silicon

EFA

lvx

Applications for Electrical Failure Analysis - Fault Localization on Package



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