FEI EFA Division

FEI (ex DCG System products) and now part of ThermoFisher Scientific, is the leading provider of diagnostic debug and characterization solutions for the global semiconductor industry

Fault Localization: Meridian IV/V/M/VII, Waferscan / DP, LVx Option, ELITE.

Design Debug: LVx Option: LVI, LVP, Phase LVI , LVT

NanoProbing: nProber III , Flexprober, Hyperion

Circuit Edit: Optifib Taipan

Sofware: NEXS software suite


Varioscale is the leader in scalable laser micromachining and novel metrology solutions. Varioscale is the only manufacturer of Laser Assisted Chemical Etching ( LACE) tool

Metrology: VarioMetric, VarioProfile

SiliconAccess - LACE: VarioEdit

SeiwaOptical co.

SEIWA Optical is a leading provider of optical solutions for FA lab semiconductor equipments, machine vision, optical microscope

Optics & Imaging : Seiwa Optical Lenses, Microscope & Camera





Teseda’s testers allow its customers to speed silicon debug, manufacturing ramp, failure analysis, and yield learning.

Testers: V550 DI Lab System, and software suite TWB & Diagnostic suite: Defect Isolator , Broken Scan Chain, Curve Tracer - check www.teseda.com website





Nisene is the world leader in automated decapsulator technology and plastic etching

Package Opening/ Decapsulation: JetEtch Copper Protect, Total Protect; PlasmaEtch - check www.nisene.com website

Focused Test


Focused Test Inc

Focused Test designs, manufactures and supports a family of power discrete and analog IC ATE (Automatic Test Equipment). FTI partners with customers to offer targeted solutions that meet analog IC test requirements. Mosfet , GAN , SiC , Power devices .

Analog Testers : FTI 1000, FTI 3000, FTI 5000




Zeiss Xradia develops technology to help advanced innovation in science and industry by providing unique insight through superior X-ray imaging solutions. Zeiss produces state-of-the-art far-field ambient environment imaging systems capable of 3D imaging with resolution better than 50 nm.

Xray 3D tomography Xradia 410 Versa, Xradia 510 Versa, Xradia 520 Versa






TeraView Limited, is the world's first and leading innovator of 3-D imaging and spectroscopic systems which exploit the properties of terahertz to characterise a wide range of materials. Applications for semiconductor is to provide innovative solution for Fault Localization on Package, with Terahertz Time Domain Reflectometry ( TDR).
Fault localisation on Package: EOTPR (Terahertz reflectometry)




MuTest is a new testing company which was created to address the Cost Of Test (COT) challenges faced by all the IC Semiconductor Companies.

Tester: M5S & M19S (Structures) & MTD864, MTCBitmap, MTMIXW, MTDPS10, ... (instruments)



Light Ray

Light Ray is a German company focusing on laser solutions and support. They have developped this Fiber Laser platform based on customer specific request, and now offering its development as release product.

Light Ray Laser Decap: Decap 10, Decap 20 

Insight KK

Predictive Images


Predictive Image

Insight offers systems in the field of non-destructive evaluation technology (NDE). In particular, Insight specialized on non-destructive analysis using Ultrasound technology: Scanning Acoustic Microscope.

Predictive Image, a non destructive analysis and diagnostic consultancy and services in the field of Acoustic Microscopy.

Scanning Acoustic Microscope: IS-202, IS-350


Semics is a key player in the domain of automated wafer probers for the semiconductor industry. Their products provide best contact and best yield.

SEMICS: OPUS3 family




IPPON designs statistical and expert algorithms for test lots quality analysis.
GAT is designed  for High Reliability Applications and for low sample size and high dimension (HDLSS).

IPPON: GAT software

We are always looking for new partners that would like to start a success story in Europe.

Do not hesitate to contact us.

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