{"id":3539,"date":"2026-09-22T14:26:15","date_gmt":"2026-09-22T12:26:15","guid":{"rendered":"https:\/\/sector-technologies.com\/?page_id=3539"},"modified":"2026-09-23T11:37:30","modified_gmt":"2026-09-23T09:37:30","slug":"optical-solutions","status":"publish","type":"page","link":"https:\/\/sector-technologies.com\/index.php\/optical-solutions\/","title":{"rendered":"Optical Solutions"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"3539\" class=\"elementor elementor-3539\">\n\t\t\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-ca30211 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"ca30211\" data-element_type=\"section\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t\t\t<div class=\"elementor-background-overlay\"><\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-19aefba\" data-id=\"19aefba\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-fda5790 elementor-widget elementor-widget-image\" data-id=\"fda5790\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img fetchpriority=\"high\" decoding=\"async\" width=\"800\" height=\"771\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/Seiwa-lenses.png\" class=\"attachment-large size-large wp-image-1569\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/Seiwa-lenses.png 853w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/Seiwa-lenses-300x289.png 300w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/Seiwa-lenses-768x740.png 768w\" sizes=\"(max-width: 800px) 100vw, 800px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-db63ba1\" data-id=\"db63ba1\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-d9e8846 elementor-widget elementor-widget-heading\" data-id=\"d9e8846\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\"><p class=\"\" align=\"center\" style=\"text-align:left\"><b><u><span style=\"font-size:20.0pt;line-height:115%;color:#00000\">Seiwa Optical Solutions<\/span><\/u><\/b><\/p>\n\n<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-825a8c0 elementor-widget elementor-widget-text-editor\" data-id=\"825a8c0\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><strong>Advanced Optical Solutions for Semiconductor Applications<\/strong><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t<div class=\"elementor-element elementor-element-a8ea26a e-flex e-con-boxed e-con e-parent\" data-id=\"a8ea26a\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t<div class=\"elementor-element elementor-element-eb6394a e-con-full e-flex e-con e-child\" data-id=\"eb6394a\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-ccd2036 elementor-widget elementor-widget-text-editor\" data-id=\"ccd2036\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p style=\"text-align: left;\"><span style=\"font-family: Helvetica; font-size: 22px;\"><strong><span style=\"color: #4b2cff;\">Overview<\/span><\/strong><\/span><\/p><p class=\"PDq2pG_selectionAnchorContainer\" dir=\"auto\" data-start=\"474\" data-end=\"608\">Seiwa Optical provides high-performance optical solutions for semiconductor failure analysis, inspection and imaging applications.<\/p><p dir=\"auto\" data-start=\"610\" data-end=\"843\">Its portfolio includes microscope objectives, infrared (IR) objectives, telecentric lenses, zoom lenses and advanced microscopy systems designed to deliver high resolution and sensitivity for demanding semiconductor applications.<\/p><p class=\"PDq2pG_selectionAnchorContainer\" dir=\"auto\" data-start=\"993\" data-end=\"1278\">High-performance optics are a critical component of semiconductor failure analysis and fault localization systems. Sector Technologies partners with Seiwa Optical to provide advanced optical solutions designed to improve imaging resolution, sensitivity and inspection capabilities.<\/p><p dir=\"auto\" data-start=\"1280\" data-end=\"1485\">A wide range of objective lenses and microscopy solutions is available to address different applications, wavelengths and system configurations, including frontside and backside semiconductor analysis.<\/p><p><span style=\"font-family: Helvetica; font-size: 22px;\"><strong><span style=\"color: #4b2cff;\">Core Technologies<\/span><\/strong><\/span><\/p><p class=\"PDq2pG_selectionAnchorContainer\" dir=\"auto\" data-start=\"1619\" data-end=\"1772\"><strong data-start=\"1619\" data-end=\"1646\">Optical &amp; IR Objectives<\/strong><br data-start=\"1646\" data-end=\"1649\" \/>High-performance M Plan APO, PE IR and PE IR Hi-Res objectives for visible and infrared semiconductor imaging applications.<\/p><p dir=\"auto\" data-start=\"1774\" data-end=\"1945\"><strong data-start=\"1774\" data-end=\"1803\">Telecentric &amp; Zoom Lenses<\/strong><br data-start=\"1803\" data-end=\"1806\" \/>Precision optical solutions for inspection, measurement and imaging applications requiring high image quality and controlled magnification.<\/p><p dir=\"auto\" data-start=\"1947\" data-end=\"2191\"><strong data-start=\"1947\" data-end=\"1969\">Microscopy Systems<\/strong><br data-start=\"1969\" data-end=\"1972\" \/>Advanced microscopy solutions for frontside and backside inspection of semiconductor devices, supporting the analysis of cracks, contamination, lamination defects, electrical discharge damage and other device anomalies.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-62bda12 e-con-full e-flex e-con e-child\" data-id=\"62bda12\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t<div class=\"elementor-element elementor-element-f5f942c e-con-full e-flex e-con e-child\" data-id=\"f5f942c\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-3f312a5 elementor-widget elementor-widget-image\" data-id=\"3f312a5\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" width=\"700\" height=\"479\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/Product_optic1.png\" class=\"attachment-large size-large wp-image-427\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/Product_optic1.png 700w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/Product_optic1-300x205.png 300w\" sizes=\"(max-width: 700px) 100vw, 700px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-aece2b3 e-con-full e-flex e-con e-child\" data-id=\"aece2b3\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-5dc2de5 elementor-widget elementor-widget-image\" data-id=\"5dc2de5\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" width=\"800\" height=\"533\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/SEIWA-micoscope.jpeg\" class=\"attachment-large size-large wp-image-1693\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/SEIWA-micoscope.jpeg 800w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/SEIWA-micoscope-300x200.jpeg 300w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/SEIWA-micoscope-768x512.jpeg 768w\" sizes=\"(max-width: 800px) 100vw, 800px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-3341a77 e-con-full e-flex e-con e-child\" data-id=\"3341a77\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-65b7c1d elementor-widget elementor-widget-image\" data-id=\"65b7c1d\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"474\" height=\"1024\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/SEIWA-microscope-474x1024.png\" class=\"attachment-large size-large wp-image-1571\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/SEIWA-microscope-474x1024.png 474w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/SEIWA-microscope-139x300.png 139w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/SEIWA-microscope.png 555w\" sizes=\"(max-width: 474px) 100vw, 474px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-4952bfc e-flex e-con-boxed e-con e-parent\" data-id=\"4952bfc\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t<div class=\"elementor-element elementor-element-73152be e-con-full e-flex e-con e-child\" data-id=\"73152be\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-cec2579 elementor-widget elementor-widget-heading\" data-id=\"cec2579\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\"><p><b><span style=\"font-size:20.0pt;line-height:115%;color:#4b2cff\">Core Optical Solutions<\/span><\/b><\/p>\n\n<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-ff656fe elementor-widget elementor-widget-text-editor\" data-id=\"ff656fe\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>Seiwa Optical offers a range of high-performance infrared objectives and microscopy solutions designed for semiconductor inspection, imaging and failure analysis applications.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-085cbda e-con-full e-flex e-con e-child\" data-id=\"085cbda\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-905fd7d e-con-full e-flex e-con e-child\" data-id=\"905fd7d\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-925fc9e elementor-widget__width-initial elementor-widget elementor-widget-image\" data-id=\"925fc9e\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"627\" height=\"235\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/PE-IR.png\" class=\"attachment-large size-large wp-image-3548\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/PE-IR.png 627w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/PE-IR-300x112.png 300w\" sizes=\"(max-width: 627px) 100vw, 627px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-a7d74ca elementor-widget elementor-widget-text-editor\" data-id=\"a7d74ca\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>\u00a0<\/p><p style=\"text-align: center;\"><span style=\"color: #3366ff;\"><strong>PE IR<\/strong><\/span><\/p><p class=\"PDq2pG_selectionAnchorContainer\" dir=\"auto\" data-start=\"708\" data-end=\"757\"><strong data-start=\"708\" data-end=\"757\">Infrared Objectives for Semiconductor Imaging<\/strong><\/p><p dir=\"auto\" data-start=\"759\" data-end=\"877\">High-performance IR objective lenses designed for backside semiconductor inspection and failure analysis applications.<\/p><ul data-start=\"879\" data-end=\"1021\"><li data-section-id=\"3a9dkd\" data-start=\"879\" data-end=\"911\">Optimized for infrared imaging<\/li><li data-section-id=\"1dksaxa\" data-start=\"912\" data-end=\"945\">High resolution and sensitivity<\/li><li data-section-id=\"1h8rdbj\" data-start=\"946\" data-end=\"981\">Multiple magnifications available 1x &#8211; 100X<\/li><li data-section-id=\"fap3q0\" data-start=\"982\" data-end=\"1021\">Suitable for backside device analysis<\/li><li data-section-id=\"fap3q0\" data-start=\"982\" data-end=\"1021\">Transmission 800nm &#8211; 1600nm<\/li><\/ul><p><span style=\"text-decoration: underline;\"><a href=\"https:\/\/www.seiwaamerica.com\/products\/pe-ir-plan\/\" target=\"_blank\" rel=\"noopener\">Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-381fa73 e-con-full e-flex e-con e-child\" data-id=\"381fa73\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-18433b1 elementor-widget__width-initial elementor-widget elementor-widget-image\" data-id=\"18433b1\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"613\" height=\"372\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/PEIR-2000.png\" class=\"attachment-large size-large wp-image-3549\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/PEIR-2000.png 613w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/PEIR-2000-300x182.png 300w\" sizes=\"(max-width: 613px) 100vw, 613px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-99f69b8 elementor-widget elementor-widget-text-editor\" data-id=\"99f69b8\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>\u00a0<\/p><p style=\"text-align: center;\"><strong style=\"color: #3366ff;\">PE IR 2000 HRS<\/strong><\/p><p class=\"PDq2pG_selectionAnchorContainer\" dir=\"auto\" data-start=\"1038\" data-end=\"1071\"><strong data-start=\"1038\" data-end=\"1071\">High-Resolution IR Objectives<\/strong><\/p><p dir=\"auto\" data-start=\"1073\" data-end=\"1206\">Advanced infrared objectives designed for demanding high resolution semiconductor applications.<\/p><ul data-start=\"1208\" data-end=\"1367\"><li data-section-id=\"1o82wu4\" data-start=\"1208\" data-end=\"1236\">High-resolution IR imaging<\/li><li data-section-id=\"hbp09t\" data-start=\"1237\" data-end=\"1268\">Optimized optical performance<\/li><li data-section-id=\"hn2qym\" data-start=\"1269\" data-end=\"1314\">Designed for advanced semiconductor devices<\/li><li data-section-id=\"uv44om\" data-start=\"1315\" data-end=\"1367\">Ideal for fault localization and backside analysis<\/li><li data-section-id=\"uv44om\" data-start=\"1315\" data-end=\"1367\">10X, 20X, 50X<\/li><li data-section-id=\"uv44om\" data-start=\"1315\" data-end=\"1367\">Transmission 1000nm &#8211; 2000nm<\/li><\/ul><p><span style=\"text-decoration: underline;\"><a href=\"https:\/\/www.seiwaamerica.com\/products\/pe-ir-2000hr\/\" target=\"_blank\" rel=\"noopener\">Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-ad6c7c3 e-con-full e-flex e-con e-child\" data-id=\"ad6c7c3\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-557cae7 elementor-widget__width-initial elementor-widget elementor-widget-image\" data-id=\"557cae7\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"460\" height=\"580\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/images-product-menu-29-SKZ-zoom-microscope-03.png\" class=\"attachment-large size-large wp-image-3550\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/images-product-menu-29-SKZ-zoom-microscope-03.png 460w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/images-product-menu-29-SKZ-zoom-microscope-03-238x300.png 238w\" sizes=\"(max-width: 460px) 100vw, 460px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-92384e6 elementor-widget elementor-widget-text-editor\" data-id=\"92384e6\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p style=\"text-align: center;\"><strong style=\"color: #3366ff;\">IR Microscope<\/strong><\/p><p class=\"PDq2pG_selectionAnchorContainer\" dir=\"auto\" data-start=\"1384\" data-end=\"1417\"><strong data-start=\"1384\" data-end=\"1417\">Infrared Microscopy Solutions<\/strong><\/p><p dir=\"auto\" data-start=\"1419\" data-end=\"1524\">Advanced microscopy systems for frontside and backside inspection of semiconductor devices and materials.<\/p><ul data-start=\"1526\" data-end=\"1679\"><li data-section-id=\"odyitz\" data-start=\"1526\" data-end=\"1561\">Frontside and backside inspection<\/li><li data-section-id=\"1w8xr9q\" data-start=\"1562\" data-end=\"1592\">Visible and infrared imaging<\/li><li data-section-id=\"1ngn11k\" data-start=\"1593\" data-end=\"1626\">Semiconductor defect inspection<\/li><li data-section-id=\"6prn3w\" data-start=\"1627\" data-end=\"1679\">Turret 5 positions<\/li><li data-section-id=\"6prn3w\" data-start=\"1627\" data-end=\"1679\">manual or motorized stage<\/li><li data-section-id=\"6prn3w\" data-start=\"1627\" data-end=\"1679\">auto focus<\/li><li data-section-id=\"6prn3w\" data-start=\"1627\" data-end=\"1679\">Powerful software<\/li><li data-section-id=\"6prn3w\" data-start=\"1627\" data-end=\"1679\">Stitching feature<\/li><\/ul><p><span style=\"text-decoration: underline;\"><a href=\"https:\/\/www.seiwaamerica.com\/products\/ir2200-infrared-microscope-nir-to-swir\/#IR2200-H116-(Automated-System)\" target=\"_blank\" rel=\"noopener\">Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-ebc8f13 e-flex e-con-boxed e-con e-parent\" data-id=\"ebc8f13\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t<div class=\"elementor-element elementor-element-aa146d6 e-con-full e-flex e-con e-child\" data-id=\"aa146d6\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-281e8a7 e-con-full e-flex e-con e-child\" data-id=\"281e8a7\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-5ee04fb elementor-widget elementor-widget-heading\" data-id=\"5ee04fb\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\"><p class=\"MsoNormal\"><b><span style=\"font-size:20.0pt;line-height:115%;color:#4b2cff\">Applications<\/span><\/b><span style=\"font-family: inherit;font-size: 2rem\"><\/span><\/p><\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-b97b793 e-con-full e-flex e-con e-child\" data-id=\"b97b793\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-4dff936 e-con-full e-flex e-con e-child\" data-id=\"4dff936\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-6eadd6c e-con-full e-flex e-con e-child\" data-id=\"6eadd6c\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-1a12ae0 elementor-widget elementor-widget-image\" data-id=\"1a12ae0\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"800\" height=\"534\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage3-1024x683.jpg\" class=\"attachment-large size-large wp-image-3558\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage3-1024x683.jpg 1024w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage3-300x200.jpg 300w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage3-768x512.jpg 768w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage3-1536x1024.jpg 1536w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage3.jpg 2048w\" sizes=\"(max-width: 800px) 100vw, 800px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-241adf0 e-con-full e-flex e-con e-child\" data-id=\"241adf0\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-566d129 elementor-widget elementor-widget-text-editor\" data-id=\"566d129\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><span style=\"color: #3366ff;\"><strong>Backside Semiconductor Imaging<\/strong><\/span><\/p><ul><li>Infrared imaging through silicon for the observation of internal device structures and features from the backside.<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-2194ff4 e-con-full e-flex e-con e-child\" data-id=\"2194ff4\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-e2447b3 e-flex e-con-boxed e-con e-child\" data-id=\"e2447b3\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-df427e3 elementor-widget elementor-widget-image\" data-id=\"df427e3\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"800\" height=\"694\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage2-1024x888.jpg\" class=\"attachment-large size-large wp-image-3559\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage2-1024x888.jpg 1024w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage2-300x260.jpg 300w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage2-768x666.jpg 768w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage2.jpg 1366w\" sizes=\"(max-width: 800px) 100vw, 800px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-c64635e e-con-full e-flex e-con e-child\" data-id=\"c64635e\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-1dafde7 elementor-widget elementor-widget-text-editor\" data-id=\"1dafde7\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><span style=\"color: #3366ff;\"><strong>Failure Analysis &amp; Fault Localization<\/strong><\/span><\/p><ul><li>High-resolution optical and infrared imaging to support defect investigation and fault localization workflows.<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-98a6109 e-con-full e-flex e-con e-child\" data-id=\"98a6109\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-2d1a124 e-con-full e-flex e-con e-child\" data-id=\"2d1a124\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-d18ea37 e-con-full e-flex e-con e-child\" data-id=\"d18ea37\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-652b074 elementor-widget elementor-widget-image\" data-id=\"652b074\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"800\" height=\"712\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage4-1024x911.jpg\" class=\"attachment-large size-large wp-image-3557\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage4-1024x911.jpg 1024w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage4-300x267.jpg 300w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage4-768x683.jpg 768w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage4.jpg 1124w\" sizes=\"(max-width: 800px) 100vw, 800px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-4fad9fb e-con-full e-flex e-con e-child\" data-id=\"4fad9fb\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-a0da3d6 elementor-widget elementor-widget-text-editor\" data-id=\"a0da3d6\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><span style=\"color: #3366ff;\"><strong>Frontside Device Inspection<\/strong><\/span><\/p><ul><li>Detailed optical inspection of semiconductor devices for the identification of cracks, contamination, surface defects and other physical anomalies.<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-7005afd e-con-full e-flex e-con e-child\" data-id=\"7005afd\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-49e8994 e-con-full e-flex e-con e-child\" data-id=\"49e8994\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-81c1035 e-con-full e-flex e-con e-child\" data-id=\"81c1035\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-ebc8d2a elementor-widget elementor-widget-image\" data-id=\"ebc8d2a\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"800\" height=\"685\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage1.jpg\" class=\"attachment-large size-large wp-image-3556\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage1.jpg 980w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage1-300x257.jpg 300w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/MicroscopeImage1-768x658.jpg 768w\" sizes=\"(max-width: 800px) 100vw, 800px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-b3567bd e-con-full e-flex e-con e-child\" data-id=\"b3567bd\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-5679331 elementor-widget elementor-widget-text-editor\" data-id=\"5679331\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><span style=\"color: #3366ff;\"><strong>Advanced Device Imaging<\/strong><\/span><\/p><ul><li>High-resolution imaging for advanced semiconductor devices where optical performance, resolution and sensitivity are critical.<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Seiwa Optical Solutions Advanced Optical Solutions for Semiconductor Applications Overview Seiwa Optical provides high-performance optical solutions for semiconductor failure analysis, inspection and imaging applications. Its portfolio includes microscope objectives, infrared (IR) objectives, telecentric lenses, zoom lenses and advanced microscopy systems designed to deliver high resolution and sensitivity for demanding semiconductor applications. High-performance optics are a [&hellip;]<\/p>\n","protected":false},"author":4,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-3539","page","type-page","status-publish","hentry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v18.2.1 (Yoast SEO v26.6) - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Optical Solutions - Sector-Technologies<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/sector-technologies.com\/index.php\/optical-solutions\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Optical Solutions\" \/>\n<meta property=\"og:description\" content=\"Seiwa Optical Solutions Advanced Optical Solutions for Semiconductor Applications Overview Seiwa Optical provides high-performance optical solutions for semiconductor failure analysis, inspection and imaging applications. 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