{"id":3482,"date":"2026-09-17T14:06:32","date_gmt":"2026-09-17T12:06:32","guid":{"rendered":"https:\/\/sector-technologies.com\/?page_id=3482"},"modified":"2026-09-21T16:09:45","modified_gmt":"2026-09-21T14:09:45","slug":"design-debug-test","status":"publish","type":"page","link":"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/","title":{"rendered":"Design Debug Test"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"3482\" class=\"elementor elementor-3482\">\n\t\t\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-ca30211 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"ca30211\" data-element_type=\"section\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t\t\t<div class=\"elementor-background-overlay\"><\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-19aefba\" data-id=\"19aefba\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-fda5790 elementor-widget elementor-widget-image\" data-id=\"fda5790\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" width=\"205\" height=\"234\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/teseda_hardward-1.jpg\" class=\"attachment-large size-large wp-image-245\" alt=\"\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-db63ba1\" data-id=\"db63ba1\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-d9e8846 elementor-widget elementor-widget-heading\" data-id=\"d9e8846\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\"><p class=\"\" align=\"center\" style=\"text-align:left\"><b><u><span style=\"font-size:20.0pt;line-height:115%;color:#00000\">Teseda Test &amp; defect Isolation<\/span><\/u><\/b><\/p>\n\n<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-825a8c0 elementor-widget elementor-widget-text-editor\" data-id=\"825a8c0\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><strong>From First Silicon to Physical Defect Isolation<\/strong><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t<div class=\"elementor-element elementor-element-a8ea26a e-flex e-con-boxed e-con e-parent\" data-id=\"a8ea26a\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t<div class=\"elementor-element elementor-element-eb6394a e-con-full e-flex e-con e-child\" data-id=\"eb6394a\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-ccd2036 elementor-widget elementor-widget-text-editor\" data-id=\"ccd2036\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p style=\"text-align: left;\"><span style=\"font-family: Helvetica; font-size: 22px;\"><strong><span style=\"color: #4b2cff;\">Overview<\/span><\/strong><\/span><\/p><p>Teseda&rsquo;s unique combination of hardware (Testers ) &amp; software (EDA tools), enables\u00a0 :<\/p><ul><li><strong>design or product engineer<\/strong>\u00a0to quickly validate initial silicon, thereby\u00a0<strong>saving weeks in the silicon verification process<\/strong>. It is focused to complete the\u00a0<a title=\" Scan chains are a technique used in Design For Test. The objective is to make testing easier by providing a simple way to set and observe every flip-flop in an IC. A special signal called scan enable is added to a design. When this signal is asserted, every flip-flop in the design is connected into a long shift register, one input pin provides the data to this chain, and one output pin is connected to the output of the chain. Then using the chip's clock signal, an arbitrary pattern can be entered into the chain of flips flops, and\/or the state of every flip flop can be read out.\u00a0 \">scan chain<\/a>\u00a0debug, getting debug independent of outsourcing testing capabilities.<\/li><li><strong>failure analysis engineer<\/strong>\u00a0to support dynamics applications on their Electrical Failure Analysis applications \u2013 taking advantage of the portable, easy to use system to quickly diagnose issues as a stand alone system or in conjunction with leading FA equipment.<\/li><\/ul><p><span style=\"font-family: Helvetica; font-size: 22px;\"><strong><span style=\"color: #4b2cff;\">Core Technologies<\/span><\/strong><\/span><\/p><p>Teseda is developping solutions to simplify approach for:<\/p><p>Developping Simple to Use Test solution\u00a0&#8211;\u00a0 thanks to Teseda hardware plateform\u00a0<strong>V550<\/strong> , in conjunction with Teseda\u2019s\u00a0<strong>TWB.\u00a0<\/strong>Input &#8211; Set-up &#8211; Analysis is simplified thanks to its unique structure: all results are still refering to your STILL structure.<\/p><p>Defect Isolation tool set\u00a0&#8211; beyond Test results provided &#8211;\u00a0<strong>Diagnostic Manager<sup>TM<\/sup><\/strong>\u00a0<strong>(DM)<\/strong>\u00a0software and\u00a0<strong>Broken Chain Analyser\u00a0(BCA)\u00a0<\/strong>modules provide Defect isolation tool kit &#8211; the unique value is that it is simple to use and user keep control on its debug (unlike other EDA solution)<\/p><p>Field Triage\u00a0package\u00a0&#8211;\u00a0Field Triage\u00a0is a simple package, with \u00ab\u00a0one button\u00a0\u00bb solution to curve tracing, leakage &amp; continuity testing &#8211; enabling fast response to your customer failure directly at your field offices. It is available either as a package with cut down version of the\u00a0V550 or as a module of test solution above.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-62bda12 e-con-full e-flex e-con e-child\" data-id=\"62bda12\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t<div class=\"elementor-element elementor-element-f5f942c e-con-full e-flex e-con e-child\" data-id=\"f5f942c\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-3f312a5 elementor-widget elementor-widget-image\" data-id=\"3f312a5\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img fetchpriority=\"high\" decoding=\"async\" width=\"800\" height=\"295\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/teseda-tester-1024x378.png\" class=\"attachment-large size-large wp-image-1572\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/teseda-tester-1024x378.png 1024w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/teseda-tester-300x111.png 300w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/teseda-tester-768x283.png 768w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/teseda-tester-1536x566.png 1536w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/teseda-tester.png 1562w\" sizes=\"(max-width: 800px) 100vw, 800px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-aece2b3 e-con-full e-flex e-con e-child\" data-id=\"aece2b3\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-5dc2de5 elementor-widget elementor-widget-image\" data-id=\"5dc2de5\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" width=\"800\" height=\"462\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/TesedaV5501.jpg\" class=\"attachment-large size-large wp-image-3505\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/TesedaV5501.jpg 869w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/TesedaV5501-300x173.jpg 300w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/TesedaV5501-768x444.jpg 768w\" sizes=\"(max-width: 800px) 100vw, 800px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-3341a77 e-con-full e-flex e-con e-child\" data-id=\"3341a77\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-65b7c1d elementor-widget elementor-widget-image\" data-id=\"65b7c1d\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"800\" height=\"521\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/GPBoard.png\" class=\"attachment-large size-large wp-image-3506\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/GPBoard.png 806w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/GPBoard-300x195.png 300w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/GPBoard-768x500.png 768w\" sizes=\"(max-width: 800px) 100vw, 800px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-4952bfc e-flex e-con-boxed e-con e-parent\" data-id=\"4952bfc\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t<div class=\"elementor-element elementor-element-73152be e-con-full e-flex e-con e-child\" data-id=\"73152be\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-cec2579 elementor-widget elementor-widget-heading\" data-id=\"cec2579\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\"><p><b><span style=\"font-size:20.0pt;line-height:115%;color:#4b2cff\">V550 Family Solutions<\/span><\/b><\/p>\n\n<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-ff656fe elementor-widget elementor-widget-text-editor\" data-id=\"ff656fe\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>Teseda hardware plateform is an portable, easy to use tester system focused in enabling high failure coverage. Unlike production\u00a0<a title=\" Automatic Test Equipment\u00a0 Any machine which performs tests automatically.\u00a0 \">ATE<\/a>, it has much more memory for failure capture. Its high failure coverage thus enabler designer scan chain debugging on silicon. It can be used as well of stimulus for the failure analysis equipements.<\/p><p><strong>The\u00a0<a title=\"Teseda Tester HW - V550\" href=\"https:\/\/sector-technologies.com\/%20\/products\/teseda-testers.html#Tester_HW_SW\" target=\"_blank\" rel=\"noopener\">V550<\/a>\u00a0supports 512 pins configurable as either data or clock<\/strong>. It is available in an 80 MHZ scan rate version, and is upgradeable to 100 MHZ. The memory subsystem includes 32 Million Vector Drive\/compare per channel (upgradeable to 64 Million), 40 Million Vector capture memory per channel and 16 Million Vector failure capture per channel.<\/p><p>The Teseda WorkBench\u2122 (<a title=\"Tester SW - TesedaWorkBench\" href=\"https:\/\/sector-technologies.com\/products\/teseda-testers.html#Tester_HW_SW\" target=\"_blank\" rel=\"noopener\">TWB<\/a>) software\u00a0<strong>exploits the full power of your DFT investment<\/strong>, enabling design, test, manufacturing and FA teams to work together to reduce time to production, accelerate yield learning, and maximize profits.<\/p><p><strong>Diagnostic Manager\u00a0(DM)\u2122<\/strong>\u00a0quickly links structural test mismatch data to its physical domain for rapid analysis and diagnosis of defects and hot spots.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-085cbda e-con-full e-flex e-con e-child\" data-id=\"085cbda\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-905fd7d e-con-full e-flex e-con e-child\" data-id=\"905fd7d\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-925fc9e elementor-widget__width-initial elementor-widget elementor-widget-image\" data-id=\"925fc9e\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"245\" height=\"144\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/teseda_v550.jpg\" class=\"attachment-large size-large wp-image-248\" alt=\"\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-a7d74ca elementor-widget elementor-widget-text-editor\" data-id=\"a7d74ca\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p style=\"text-align: center;\"><span style=\"color: #3366ff;\"><strong>V550<\/strong><\/span><\/p><ul><li>512 I\/O pins with up to 100 Mhz frequency<\/li><li>Supports functional and scan-based testing, BIST and IDDQ measurements<\/li><li>64Mb per pin pattern depth with up to 40Mb of acquire memory<\/li><li>Flexible, per-pin timing capabilities for complex testing needs<\/li><li>DC parametric and Curve Tracing options<\/li><li>Comprehensive fixturing and interfacing options<\/li><li>Portable, lightweight and air-cooled &#8211; weighs just 13.5 lbs<\/li><\/ul><p><span style=\"text-decoration: underline;\"><a href=\"https:\/\/www.teseda.com\/datasheets\/Diagnostic%20Test%20Hardware%20Datasheet%20Feb%202018.pdf\" target=\"_blank\" rel=\"noopener\">Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-381fa73 e-con-full e-flex e-con e-child\" data-id=\"381fa73\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-18433b1 elementor-widget__width-initial elementor-widget elementor-widget-image\" data-id=\"18433b1\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"345\" height=\"265\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/teseda_TWB.jpg\" class=\"attachment-large size-large wp-image-249\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/teseda_TWB.jpg 345w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/teseda_TWB-300x230.jpg 300w\" sizes=\"(max-width: 345px) 100vw, 345px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-99f69b8 elementor-widget elementor-widget-text-editor\" data-id=\"99f69b8\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p style=\"text-align: center;\"><strong style=\"color: #3366ff;\">Teseda Work Bench ( TWB)<\/strong><\/p><ul><li>DFT-enabled software<\/li><li>Interactive test program creation<\/li><li>Graphical debug<\/li><li>provide fast, explicit, diagnostic information based on the design and DFT hierarchical<\/li><li>Turn days of debug time into hours.<\/li><\/ul><p><span style=\"text-decoration: underline;\"><a href=\"https:\/\/www.teseda.com\/datasheets\/Teseda%20WorkBench%20Datasheet%201.7.14.pdf\" target=\"_blank\" rel=\"noopener\">Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-ad6c7c3 e-con-full e-flex e-con e-child\" data-id=\"ad6c7c3\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-557cae7 elementor-widget__width-initial elementor-widget elementor-widget-image\" data-id=\"557cae7\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"245\" height=\"159\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/teseda_netxy1.jpg\" class=\"attachment-large size-large wp-image-250\" alt=\"\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-92384e6 elementor-widget elementor-widget-text-editor\" data-id=\"92384e6\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p style=\"text-align: center;\"><strong style=\"color: #3366ff;\">Defect Isolator (DI)\u00a0<\/strong><\/p><ul><li>links structural test mismatch data to its physical domain<\/li><li>bridges design, test, manufacturing and failure analysis<\/li><li>provides the logical to physical correlation<\/li><li>\u00a0<\/li><\/ul><p><span style=\"text-decoration: underline;\"><a href=\"https:\/\/www.teseda.com\/datasheets\/Defect%20Isolator%20Datasheet%201.7.14.pdf\" target=\"_blank\" rel=\"noopener\">Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-72728e9 e-flex e-con-boxed e-con e-parent\" data-id=\"72728e9\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t<div class=\"elementor-element elementor-element-465b44c e-con-full e-flex e-con e-child\" data-id=\"465b44c\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-0620946 elementor-widget elementor-widget-heading\" data-id=\"0620946\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\"><p><b><span style=\"font-size:20.0pt;line-height:115%;color:#4b2cff\">Additional Software Solutions<\/span><\/b><\/p>\n\n<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-2e7f93d elementor-widget elementor-widget-text-editor\" data-id=\"2e7f93d\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><strong>Automated Diagnosis of Failing Chain Flip-Flops<\/strong><\/p><p>Teseda\u2019s\u00a0<strong>Broken Chain Analyzer<\/strong>\u00a0fully exploits the power of your existing DFT-based tests to automatically analyze captured tester fail logs and detect all common causes of scan chain failures &#8211; both hard (stuck-at fails) and soft (timing or voltage-related fails) down to the failing bit location. The user simply executes a standard chain flush and a small sample of\u00a0<a title=\" ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method\/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables testers to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.\u00a0 \">ATPG<\/a>\u00a0test patterns to capture a resulting fail signature. Fail logs can then be imported into\u00a0<strong>Broken Chain Analyzer<\/strong>, along with the test pattern for automated failure diagnosis.<\/p><p>Diagnosis is performed using our interactive GUI, or diagnose multiple sets of captured fail logs via an automated batch mode. Diagnosed chain bit fails can then be easily analyzed by Teseda\u2019s\u00a0<strong>Diagnostic Manager\u00a0NetXY\u2122<\/strong>\u00a0to identify the physical location of the individual net that is the likely causing the failure in the scan chain.<\/p><p><strong>Field Triage<\/strong><\/p><p>Fast response time to your customer &amp; Cut Factory Failure Analysis Loading by as Much as 40%.<\/p><p>Teseda\u2019s\u00a0<strong>DC\u00a0Field Triage\u2122 Package<\/strong>\u00a0provides the user with easy to use, automated screening tools for DC related device failures. Designed for use by field personnel, the\u00a0<strong>DC\u00a0Field Triage\u00a0Package<\/strong>\u00a0puts device failure triage into the design and field support centers, enabling fast, timely and detailed responses to your customer\u2019s quality concerns. Since first-level field screening is done in the field, factory failure analysis tasks are offloaded by as much as 40%.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-619cfa2 e-con-full e-flex e-con e-child\" data-id=\"619cfa2\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-29456e6 e-con-full e-flex e-con e-child\" data-id=\"29456e6\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-e204656 elementor-widget__width-initial elementor-widget elementor-widget-image\" data-id=\"e204656\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"406\" height=\"251\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/BCA1.png\" class=\"attachment-large size-large wp-image-3509\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/BCA1.png 406w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/BCA1-300x185.png 300w\" sizes=\"(max-width: 406px) 100vw, 406px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-8c0719e elementor-widget elementor-widget-text-editor\" data-id=\"8c0719e\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p style=\"text-align: center;\"><span style=\"color: #3366ff;\"><strong>Broken Scan Chain Analyser<\/strong><\/span><\/p><p><strong>Key Capabilities<\/strong><\/p><ul><li>Analyzes scan fail logs determine specific failing bit location within a defective scan chain<\/li><li>Works with all EDA-generated patterns and captured scan fail logs<\/li><li>Analyzes scan fail logs from any source<\/li><li>Identify the physical location of causes of scan chain faults<\/li><\/ul><p><span style=\"text-decoration: underline;\"><a href=\"https:\/\/www.teseda.com\/datasheets\/Broken%20Chain%20Analyzer%20Datasheet%201.7.14.pdf\" target=\"_blank\" rel=\"noopener\">Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-fd2ebf6 e-con-full e-flex e-con e-child\" data-id=\"fd2ebf6\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-6423e4f elementor-widget__width-initial elementor-widget elementor-widget-image\" data-id=\"6423e4f\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"427\" height=\"272\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/CurveTracer2.png\" class=\"attachment-large size-large wp-image-3511\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/CurveTracer2.png 427w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/CurveTracer2-300x191.png 300w\" sizes=\"(max-width: 427px) 100vw, 427px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-3b75f0b elementor-widget elementor-widget-text-editor\" data-id=\"3b75f0b\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p style=\"text-align: center;\"><strong style=\"color: #3366ff;\">Curve Tracing Software<\/strong><\/p><p><strong>Key Capabilities<\/strong><\/p><ul><li>Fast and easy curve tracing of semiconductor devices<\/li><li>Built-in continuity and input leakage test measurements<\/li><li>Simple operator interface<\/li><li>Compare captured DC curves with \u201cgolden\u201d results<\/li><li>User interface and data logging based on industry standard Microsoft Excel\u00ae spreadsheets<\/li><\/ul><p><span style=\"text-decoration: underline;\"><a href=\"https:\/\/www.teseda.com\/datasheets\/Curve%20Tracer%20Datasheet%206.17.14.pdf\" target=\"_blank\" rel=\"noopener\">Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-7266761 e-con-full e-flex e-con e-child\" data-id=\"7266761\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-04fc139 elementor-widget__width-initial elementor-widget elementor-widget-image\" data-id=\"04fc139\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"511\" height=\"297\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/CurveTracer1.png\" class=\"attachment-large size-large wp-image-3512\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/CurveTracer1.png 511w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/CurveTracer1-300x174.png 300w\" sizes=\"(max-width: 511px) 100vw, 511px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-8cb09bd elementor-widget elementor-widget-text-editor\" data-id=\"8cb09bd\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p style=\"text-align: center;\"><span style=\"color: #3366ff;\"><strong>Parametric Field Triage<\/strong><\/span><\/p><p><strong>Key Capabilities<\/strong><\/p><ul><li>Screen for parametric defects in the field<\/li><li>Designed for use in both Field Support Centers and factory-based FA labs<\/li><li>Simple Microsoft Excel-based interface<\/li><li>Adds powerful curve-tracing features to your existing Teseda tools<\/li><\/ul><p><span style=\"text-decoration: underline;\"><a href=\"https:\/\/www.teseda.com\/datasheets\/Field%20Triage%20System%20Datasheet%201.7.14.pdf\" target=\"_blank\" rel=\"noopener\">Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-ebc8f13 e-flex e-con-boxed e-con e-parent\" data-id=\"ebc8f13\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t<div class=\"elementor-element elementor-element-aa146d6 e-con-full e-flex e-con e-child\" data-id=\"aa146d6\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-281e8a7 e-con-full e-flex e-con e-child\" data-id=\"281e8a7\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-5ee04fb elementor-widget elementor-widget-heading\" data-id=\"5ee04fb\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\"><p class=\"MsoNormal\"><b><span style=\"font-size:20.0pt;line-height:115%;color:#4b2cff\">Applications<\/span><\/b><span style=\"font-family: inherit;font-size: 2rem\"><\/span><\/p><\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-b97b793 e-con-full e-flex e-con e-child\" data-id=\"b97b793\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-4dff936 e-con-full e-flex e-con e-child\" data-id=\"4dff936\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-6eadd6c e-con-full e-flex e-con e-child\" data-id=\"6eadd6c\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-1a12ae0 elementor-widget elementor-widget-image\" data-id=\"1a12ae0\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"638\" height=\"412\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/TesedaScope1.png\" class=\"attachment-large size-large wp-image-3519\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/TesedaScope1.png 638w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/TesedaScope1-300x194.png 300w\" sizes=\"(max-width: 638px) 100vw, 638px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-241adf0 e-con-full e-flex e-con e-child\" data-id=\"241adf0\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-566d129 elementor-widget elementor-widget-text-editor\" data-id=\"566d129\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><span style=\"color: #3366ff;\"><strong>First Silicon Bring Up<\/strong><\/span><\/p><ul><li>Test program creation with STIL vectors<\/li><li>Easy debug of functional and scan vectors<\/li><li>Complete timing analysis and debug<\/li><li>Schmoo plots for various parameters<\/li><li>Graphical and interactive software<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-2194ff4 e-con-full e-flex e-con e-child\" data-id=\"2194ff4\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-e2447b3 e-flex e-con-boxed e-con e-child\" data-id=\"e2447b3\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-df427e3 elementor-widget elementor-widget-image\" data-id=\"df427e3\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"237\" height=\"222\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/BCA2.png\" class=\"attachment-large size-large wp-image-3508\" alt=\"\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-c64635e e-con-full e-flex e-con e-child\" data-id=\"c64635e\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-1dafde7 elementor-widget elementor-widget-text-editor\" data-id=\"1dafde7\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><span style=\"color: #3366ff;\"><strong>Scan Chain Debug<\/strong><\/span><\/p><ul><li>Locate and isolate the failing scan cell within a failing scan chain<\/li><li>Find broken scan chain<\/li><li>Link test fail to physical location<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-98a6109 e-con-full e-flex e-con e-child\" data-id=\"98a6109\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-2d1a124 e-con-full e-flex e-con e-child\" data-id=\"2d1a124\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-d18ea37 e-con-full e-flex e-con e-child\" data-id=\"d18ea37\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-652b074 elementor-widget elementor-widget-image\" data-id=\"652b074\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"625\" height=\"497\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/TesedaDirectDocking.jpg\" class=\"attachment-large size-large wp-image-3517\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/TesedaDirectDocking.jpg 625w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/TesedaDirectDocking-300x239.jpg 300w\" sizes=\"(max-width: 625px) 100vw, 625px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-4fad9fb e-con-full e-flex e-con e-child\" data-id=\"4fad9fb\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-a0da3d6 elementor-widget elementor-widget-text-editor\" data-id=\"a0da3d6\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><span style=\"color: #3366ff;\"><strong>Device stimulation for failure analysis<\/strong><\/span><\/p><ul><li>Very easy setup inside OFI tools<\/li><li>No induced vibration<\/li><li>Interactive software for playing with parameters<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-7005afd e-con-full e-flex e-con e-child\" data-id=\"7005afd\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-49e8994 e-con-full e-flex e-con e-child\" data-id=\"49e8994\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-81c1035 e-con-full e-flex e-con e-child\" data-id=\"81c1035\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-ebc8d2a elementor-widget elementor-widget-image\" data-id=\"ebc8d2a\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"800\" height=\"655\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/DI_Software-1024x839.png\" class=\"attachment-large size-large wp-image-3521\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/DI_Software-1024x839.png 1024w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/DI_Software-300x246.png 300w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/DI_Software-768x629.png 768w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/DI_Software-1536x1258.png 1536w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/DI_Software.png 1807w\" sizes=\"(max-width: 800px) 100vw, 800px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-b3567bd e-con-full e-flex e-con e-child\" data-id=\"b3567bd\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-5679331 elementor-widget elementor-widget-text-editor\" data-id=\"5679331\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><span style=\"color: #3366ff;\"><strong>Defect Isolation with DI software<\/strong><\/span><\/p><ul><li>Traverse through the physical design to trace nets and vias down to the defect location<\/li><li>Utilizes industry standard LEF\/DEF design files, scan-based test information, tester fail logs and diagnostic reports to determine and isolate the physical defect location<\/li><li>Interactive layout viewer displays scan chains, mapped mismatches of scan cells, layers, nets and subnets with search capabilities (component, net, cell)<\/li><li>Physical XY coordinates are always displayed for components and nets to guide the user through the design to quickly identify suspect sites for FA using techniques like Emission, OBIRCH, LIVA, TIVA, or FIB<\/li><li>Compatibility with emulation and ATE-based workflows<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Teseda Test &amp; defect Isolation From First Silicon to Physical Defect Isolation Overview Teseda&rsquo;s unique combination of hardware (Testers ) &amp; software (EDA tools), enables\u00a0 : design or product engineer\u00a0to quickly validate initial silicon, thereby\u00a0saving weeks in the silicon verification process. It is focused to complete the\u00a0scan chain\u00a0debug, getting debug independent of outsourcing testing capabilities. [&hellip;]<\/p>\n","protected":false},"author":4,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-3482","page","type-page","status-publish","hentry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v18.2.1 (Yoast SEO v26.6) - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Design Debug Test - Sector-Technologies<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Design Debug Test\" \/>\n<meta property=\"og:description\" content=\"Teseda Test &amp; defect Isolation From First Silicon to Physical Defect Isolation Overview Teseda&rsquo;s unique combination of hardware (Testers ) &amp; software (EDA tools), enables\u00a0 : design or product engineer\u00a0to quickly validate initial silicon, thereby\u00a0saving weeks in the silicon verification process. It is focused to complete the\u00a0scan chain\u00a0debug, getting debug independent of outsourcing testing capabilities. [&hellip;]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/\" \/>\n<meta property=\"og:site_name\" content=\"Sector-Technologies\" \/>\n<meta property=\"article:modified_time\" content=\"2026-09-21T14:09:45+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/teseda_hardward-1.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"205\" \/>\n\t<meta property=\"og:image:height\" content=\"234\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Dur\u00e9e de lecture estim\u00e9e\" \/>\n\t<meta name=\"twitter:data1\" content=\"9 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/\",\"url\":\"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/\",\"name\":\"Design Debug Test - Sector-Technologies\",\"isPartOf\":{\"@id\":\"https:\/\/sector-technologies.com\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/#primaryimage\"},\"image\":{\"@id\":\"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/#primaryimage\"},\"thumbnailUrl\":\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/teseda_hardward-1.jpg\",\"datePublished\":\"2026-09-17T12:06:32+00:00\",\"dateModified\":\"2026-09-21T14:09:45+00:00\",\"breadcrumb\":{\"@id\":\"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/#breadcrumb\"},\"inLanguage\":\"fr-FR\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"fr-FR\",\"@id\":\"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/#primaryimage\",\"url\":\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/teseda_hardward-1.jpg\",\"contentUrl\":\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/teseda_hardward-1.jpg\",\"width\":205,\"height\":234},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/sector-technologies.com\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Design Debug Test\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/sector-technologies.com\/#website\",\"url\":\"https:\/\/sector-technologies.com\/\",\"name\":\"Sector-Technologies\",\"description\":\"Providing Effective Solutions ...\",\"publisher\":{\"@id\":\"https:\/\/sector-technologies.com\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/sector-technologies.com\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"fr-FR\"},{\"@type\":\"Organization\",\"@id\":\"https:\/\/sector-technologies.com\/#organization\",\"name\":\"Sector-Technologies\",\"url\":\"https:\/\/sector-technologies.com\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"fr-FR\",\"@id\":\"https:\/\/sector-technologies.com\/#\/schema\/logo\/image\/\",\"url\":\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/logo.png\",\"contentUrl\":\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/logo.png\",\"width\":280,\"height\":71,\"caption\":\"Sector-Technologies\"},\"image\":{\"@id\":\"https:\/\/sector-technologies.com\/#\/schema\/logo\/image\/\"}}]}<\/script>\n<!-- \/ Yoast SEO Premium plugin. -->","yoast_head_json":{"title":"Design Debug Test - Sector-Technologies","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/","og_locale":"fr_FR","og_type":"article","og_title":"Design Debug Test","og_description":"Teseda Test &amp; defect Isolation From First Silicon to Physical Defect Isolation Overview Teseda&rsquo;s unique combination of hardware (Testers ) &amp; software (EDA tools), enables\u00a0 : design or product engineer\u00a0to quickly validate initial silicon, thereby\u00a0saving weeks in the silicon verification process. It is focused to complete the\u00a0scan chain\u00a0debug, getting debug independent of outsourcing testing capabilities. [&hellip;]","og_url":"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/","og_site_name":"Sector-Technologies","article_modified_time":"2026-09-21T14:09:45+00:00","og_image":[{"width":205,"height":234,"url":"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/teseda_hardward-1.jpg","type":"image\/jpeg"}],"twitter_card":"summary_large_image","twitter_misc":{"Dur\u00e9e de lecture estim\u00e9e":"9 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/","url":"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/","name":"Design Debug Test - Sector-Technologies","isPartOf":{"@id":"https:\/\/sector-technologies.com\/#website"},"primaryImageOfPage":{"@id":"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/#primaryimage"},"image":{"@id":"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/#primaryimage"},"thumbnailUrl":"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/teseda_hardward-1.jpg","datePublished":"2026-09-17T12:06:32+00:00","dateModified":"2026-09-21T14:09:45+00:00","breadcrumb":{"@id":"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/#breadcrumb"},"inLanguage":"fr-FR","potentialAction":[{"@type":"ReadAction","target":["https:\/\/sector-technologies.com\/index.php\/design-debug-test\/"]}]},{"@type":"ImageObject","inLanguage":"fr-FR","@id":"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/#primaryimage","url":"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/teseda_hardward-1.jpg","contentUrl":"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/teseda_hardward-1.jpg","width":205,"height":234},{"@type":"BreadcrumbList","@id":"https:\/\/sector-technologies.com\/index.php\/design-debug-test\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/sector-technologies.com\/"},{"@type":"ListItem","position":2,"name":"Design Debug Test"}]},{"@type":"WebSite","@id":"https:\/\/sector-technologies.com\/#website","url":"https:\/\/sector-technologies.com\/","name":"Sector-Technologies","description":"Providing Effective Solutions ...","publisher":{"@id":"https:\/\/sector-technologies.com\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/sector-technologies.com\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"fr-FR"},{"@type":"Organization","@id":"https:\/\/sector-technologies.com\/#organization","name":"Sector-Technologies","url":"https:\/\/sector-technologies.com\/","logo":{"@type":"ImageObject","inLanguage":"fr-FR","@id":"https:\/\/sector-technologies.com\/#\/schema\/logo\/image\/","url":"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/logo.png","contentUrl":"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/logo.png","width":280,"height":71,"caption":"Sector-Technologies"},"image":{"@id":"https:\/\/sector-technologies.com\/#\/schema\/logo\/image\/"}}]}},"_links":{"self":[{"href":"https:\/\/sector-technologies.com\/index.php\/wp-json\/wp\/v2\/pages\/3482","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/sector-technologies.com\/index.php\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/sector-technologies.com\/index.php\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/sector-technologies.com\/index.php\/wp-json\/wp\/v2\/users\/4"}],"replies":[{"embeddable":true,"href":"https:\/\/sector-technologies.com\/index.php\/wp-json\/wp\/v2\/comments?post=3482"}],"version-history":[{"count":28,"href":"https:\/\/sector-technologies.com\/index.php\/wp-json\/wp\/v2\/pages\/3482\/revisions"}],"predecessor-version":[{"id":3535,"href":"https:\/\/sector-technologies.com\/index.php\/wp-json\/wp\/v2\/pages\/3482\/revisions\/3535"}],"wp:attachment":[{"href":"https:\/\/sector-technologies.com\/index.php\/wp-json\/wp\/v2\/media?parent=3482"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}