{"id":3289,"date":"2026-09-08T16:27:42","date_gmt":"2026-09-08T14:27:42","guid":{"rendered":"https:\/\/sector-technologies.com\/?page_id=3289"},"modified":"2026-09-14T17:58:40","modified_gmt":"2026-09-14T15:58:40","slug":"power-device-test","status":"publish","type":"page","link":"https:\/\/sector-technologies.com\/index.php\/power-device-test\/","title":{"rendered":"Power Device Test"},"content":{"rendered":"\t\t
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Power Device Test<\/span><\/u><\/b><\/p>\n\n<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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High Power Test\u00a0<\/em><\/span><\/p>

Fast Switching Speed<\/em><\/span><\/p>

Turn Key Solution<\/em><\/span><\/p>

Operator Safety<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t

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Overview<\/span><\/strong><\/span><\/p>

Wide-bandgap (WBG) power devices such as SiC and GaN require a completely different approach to characterization than the previous generation of Si power products. Higher powers, significantly faster switching speeds and a wide range of necessary performance standards such as JESD 24-9, JESD 24-10 and AQG-324, all place new demands on the power analyser.<\/p>

It has become essential to characterize and test those devices as close as possible to their mission profile.<\/p>

Core Technologies<\/span><\/strong><\/span><\/p>

As a complete solution for Wide-Bandgap device testing, Cosmic lab systems are built to accelerate how engineers\u00a0characterize power devices<\/strong>\u00a0\u2013 whether in research, development, or pre-production.
From initial setup to high-voltage test execution and result reporting, our platform is\u00a0comprehensive, precise, and safe<\/strong>. With modular hardware, intuitive software, and UKAS-traceable calibration, Cosmic gives labs the ability to generate real, actionable insight \u2013 faster and with fewer variables.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Solutions<\/span><\/b><\/p>\n\n

The Quasar200\u00a0and Pulsar600\u00a0Power Characterization Testers make it quick and easy to measure WBG power device performance.\nQuasar200\u00a0is ideal for Si, GaN and lower power SiC testing. Pulsar600\u00a0is our ultimate characterization solution for ultra high current applications, particularly SiC, invertor and automative applications.\n\nThe FTI-1000 Flexible is a compact DC characterization platform designed for medium-power\u00a0Si and GaN devices. Delivering up to\u00a01.2 kV and 100 A\u00a0of programmable DC stimulus, it enables accurate extraction of static electrical parameters across a broad range of discrete packages..<\/span><\/p>\n\n<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Quasar 200<\/strong><\/span><\/p>

DC Test : 3000 V , 200A<\/p>

AC Test : 1200V, 1200A<\/p>

Integrated software\u00a0<\/p>

Comprehensive Safety for operator<\/p>

Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Pulsar 600<\/strong><\/p>

DC Test : 3000 V , 600A<\/p>

AC Test : 1400V, 3000A<\/p>

Integrated software\u00a0<\/p>

Comprehensive Safety for operator<\/p>

Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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\u00a0<\/p>

FTI-1000 LAB<\/strong><\/span><\/p>

DC Test : 1200 V , 100A<\/p>

Rdson, Idon, Vce(sat), Vgs, Gfs, Igss, Idss<\/p>

AC Test : Rdson dynamic<\/p>

Integrated software\u00a0<\/p>

Comprehensive Safety for operator<\/p>

Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Power Devices Test applications<\/span><\/b><\/span><\/p><\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Some examples of common test on SIC and GAN devices<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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2kA type 1 short circuit on a SIC MOSFET<\/strong><\/span><\/p>

Vds = 600V, Vgs = 13V<\/p>

Id = 2.02kA<\/p>

Time = 4\u00b5s<\/p>

3 * TO247-4 in parallel<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Breakdown Voltage<\/strong><\/span><\/p>

BVDSS<\/p>

1.7kV @ 1mA<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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VDS @ 100A<\/strong><\/span><\/p>

\u00a0<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Multi-pulse reverse recovery test on a SIC MOSFET<\/strong><\/span><\/p>

Vds = 800V, Vgs = 15V<\/p>

Rg (on) = 5 Ohm, RG ( Off) = 10 Ohm<\/p>

Loop = 2<\/p>

1 * TO247-4\u00a0<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Multi-pulse CIL test on a SIC MOSFET<\/strong><\/span><\/p>

Vds = 800V, Vgs = 15V<\/p>

Rg (on) = 5 Ohm, RG ( Off) = 100 Ohm<\/p>

Id = 150A<\/p>

Pulse = 7<\/p>

1 * TO247-4\u00a0<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"

Power Device Test High Power Test\u00a0 Fast Switching Speed Turn Key Solution Operator Safety Overview Wide-bandgap (WBG) power devices such as SiC and GaN require a completely different approach to characterization than the previous generation of Si power products. Higher powers, significantly faster switching speeds and a wide range of necessary performance standards such as […]<\/p>\n","protected":false},"author":4,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-3289","page","type-page","status-publish","hentry"],"yoast_head":"\nPower Device Test - Sector-Technologies<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/sector-technologies.com\/index.php\/power-device-test\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Power Device Test\" \/>\n<meta property=\"og:description\" content=\"Power Device Test High Power Test\u00a0 Fast Switching Speed Turn Key Solution Operator Safety Overview Wide-bandgap (WBG) power devices such as SiC and GaN require a completely different approach to characterization than the previous generation of Si power products. 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