{"id":2792,"date":"2026-05-06T08:28:58","date_gmt":"2026-05-06T06:28:58","guid":{"rendered":"https:\/\/sector-technologies.com\/?page_id=2792"},"modified":"2026-09-01T19:47:43","modified_gmt":"2026-09-01T17:47:43","slug":"optical-failure-isolation","status":"publish","type":"page","link":"https:\/\/sector-technologies.com\/index.php\/optical-failure-isolation\/","title":{"rendered":"Optical Failure Isolation"},"content":{"rendered":"\t\t
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Optical Failure Isolation<\/span><\/u><\/b><\/p>\n\n<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Static and Dynamic Failure Isolation<\/p>

on Advanced Microelectronics component (PCB, package, Wafer and die) \u00a0<\/p>

Proven for 7 nm<\/em><\/span><\/p>

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Overview<\/span><\/strong><\/span><\/p>

The capability to reveal defect, at the microscopic scale, on semiconductors devices is a key parameters to Optimize your yield and qualification processes, as well as providing a high level of quality to your customer through fast and efficient customer return analysis.<\/span><\/p>

Core Technologies<\/span><\/strong><\/span><\/p>

Through a large range of Electrical Failure Isolation (EFI) techniques and methods, ThermoFisher EFI tools set solution allows addressing this problematic from PCB level, going through complex packaging assembly, down to wafer and die level and single defective transistor or metallization identification.<\/span><\/p>

Mid Infrared, Near Infrared, Visible and EBeam based techniques are available on ELITE and Meridian extended porfolio, with a high level of configurability depending on your current needs and requirements.<\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Lock in thermography solutions : Elite<\/span><\/b><\/p>\n

Revolutionary progress in 2.5D and 3D packaging, increasingly complex interconnect architectures, and next-generation power devices are introducing new challenges in semiconductor failure analysis. As components shrink while growing in complexity, defects often appear as localized irregularities in power dissipation, generating subtle thermal signatures that are essential for diagnosing root causes.\nThe ThermoFisher ELITE System is a high-precision fault isolation solution designed to quickly and non-destructively locate defects using advanced IR lock-in thermography. Featuring patented noise reduction technologies, it achieves high sensitivity in defect detection. Its ability to integrate high-resolution infrared imaging with laser scanning microscopy ensures outstanding accuracy, helping accelerate the identification of failure mechanisms. \nELITE VX is also available to address Failure Isolation on Power devices up to 10kV.\n<\/b><\/p>

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Elite Lite<\/strong><\/span><\/p>

Localize defects (Shorts, leakage and opens) in module, package<\/p>

Lock In Thermography,\u00a0<\/p>

Option: Absolute Temperature Mapping, 3D localization<\/p>

Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Elite<\/strong><\/p>

Localize defects (Shorts, leakage and opens) in module, package and die<\/p>

Lock In Thermography, LSM imaging and OBIRCh<\/p>

VX version to cover power devices up to 10kV<\/p>

Option: Laser Marking, Absolute Temperature Mapping, Flexible probing\u2026<\/p>

Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Elite 300<\/strong><\/span><\/p>

Localize defects (Shorts, leakage and opens) wafer 300mm, package and die<\/p>

Lock In Thermography, LSM imaging and OBIRCh<\/p>

Option: Laser Marking, Absolute Temperature Mapping, Flexible probing\u2026<\/p>

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Emission microscopy and LSM solutions: Meridian family<\/span><\/b><\/p>\n

The ThermoFisher Meridian Family is designed to perform inverted photon emission (EMMI) and laser scanning microscopy analysis on devices stimulated by static bias via probe card or micro-probes. With the overall cost of ownership for the system being a critical aspect of profitability.

The Meridian S System offers a range of photon emission options, dual-side probing flexibility and an upgrade path to dynamic optical fault isolation capabilities such as laser voltage imaging\/probing and soft defect localization

The Meridian S System is designed for use in failure analysis labs worldwide, for Identification of systematic process, design or integration issues and Isolation of root cause for random electrical failures.

The Meridian 4 System is the preferred choice for developers of advanced, low-voltage, high-density semiconductor devices requiring performance and the ability to diagnose wide-ranging failure modes, including parametric failures and those resulting from design-process marginalities.

With time-to-yield being critical to profitability, it is too costly for advanced foundries, integrated device manufacturers and fabless companies to wait until after dicing and packaging to identify the source of electrical faults. The Meridian WS and WS-DP system enable faster defect localization by using production testers, load boards, and probe cards on full 300mm\/200mm\nwafers. <\/b><\/p>

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Meridian S<\/strong><\/span><\/p>

Localize defects (Shorts, leakage and opens) on silicon dies or piece of wafers<\/p>

Photon Emission, OBIRCh, Solid Immersion Lenses (SIL)<\/p>

Option: High Voltage Option (EMMI and OBIRCh) for SiC and GaN investigation, Laser marking, CAD connectivity\u2026<\/p>

Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Meridian IV<\/strong><\/p>

Localize defects (Shorts, leakage and opens) on silicon dies or piece of wafers<\/p>

Photon Emission, OBIRCh, LADA, Laser Voltage Imaging and Probing, Solid Immersion Lenses (SIL)<\/p>

Option: Time Resolved LADA, CAD connectivity\u2026<\/p>

Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Meridian Waferscan<\/strong><\/span><\/p>

Localize defects (Shorts, leakage and opens) on full 300mm and 200mm wafers<\/p>

Photon Emission, OBIRCh, LADA, Laser Voltage Imaging and Probing, Solid Immersion Lenses (SIL)<\/p>

Automated Probe To Pad Alignment, Automated Die to Die stepping<\/p>

Option: Timed work flow Resolved LADA, CAD connectivity\u2026<\/p>

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Applications<\/span><\/b><\/span><\/p><\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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PCB and package level Failure Isolation<\/strong><\/span><\/p>

\u2022 Lock In Thermography for short and leakage detection
\u2022 RF-LIT for Open detection \u2013 New
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Power Electronics Failure <\/strong><\/span><\/p>\n

\u2022 High Voltage certified solution, up to 10kV application
\n\u2022 LIT, OBIRCh and Photon Emission techniques compatibility<\/p>


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Silicon Level Static Failure Isolation<\/strong><\/span><\/p>

\u2022 Static Photon Emission and OBIRCh (Best in class sensitivity)
\u2022 Inverted architecture for backside investigation on packaged dies and piece of wafer<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Silicon Level Dynamic Failure Isolation<\/strong><\/span><\/p>

\u2022 Laser Voltage Imaging and Probing technique for transistor level investigations
\u2022 Dynamic Laser Stimulation techniques (LADA, SDL\u2026)
\u2022 Dynamic Photon Emission with best in class cameras
\u2022 Inverted architecture compatible with dynamic Emulation (ATE)<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Wafer level Failure Isolation for Yield ramp up <\/strong><\/span><\/p>

\u2022 Static Photon Emission and OBIRCh (Best in class sensitivity) & LVx for scan chain debug
\u2022 Inverted architecture for backside investigation on full 300mm wafers
\u2022 Cantilever and vertical probe card compatible<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"

Optical Failure Isolation Static and Dynamic Failure Isolation on Advanced Microelectronics component (PCB, package, Wafer and die) \u00a0 Proven for 7 nm \u00a0 Overview The capability to reveal defect, at the microscopic scale, on semiconductors devices is a key parameters to Optimize your yield and qualification processes, as well as providing a high level of […]<\/p>\n","protected":false},"author":4,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-2792","page","type-page","status-publish","hentry"],"yoast_head":"\nOptical Failure Isolation - Sector-Technologies<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/sector-technologies.com\/index.php\/optical-failure-isolation\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Optical Failure Isolation\" \/>\n<meta property=\"og:description\" content=\"Optical Failure Isolation Static and Dynamic Failure Isolation on Advanced Microelectronics component (PCB, package, Wafer and die) \u00a0 Proven for 7 nm \u00a0 Overview The capability to reveal defect, at the microscopic scale, on semiconductors devices is a key parameters to Optimize your yield and qualification processes, as well as providing a high level of […]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/sector-technologies.com\/index.php\/optical-failure-isolation\/\" \/>\n<meta property=\"og:site_name\" content=\"Sector-Technologies\" \/>\n<meta property=\"article:modified_time\" content=\"2026-09-01T17:47:43+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/Meridian-application-2.png\" \/>\n\t<meta property=\"og:image:width\" content=\"495\" \/>\n\t<meta property=\"og:image:height\" content=\"461\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/png\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Dur\u00e9e de lecture estim\u00e9e\" \/>\n\t<meta name=\"twitter:data1\" content=\"8 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/sector-technologies.com\/index.php\/optical-failure-isolation\/\",\"url\":\"https:\/\/sector-technologies.com\/index.php\/optical-failure-isolation\/\",\"name\":\"Optical Failure Isolation - 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