{"id":2792,"date":"2026-05-06T08:28:58","date_gmt":"2026-05-06T06:28:58","guid":{"rendered":"https:\/\/sector-technologies.com\/?page_id=2792"},"modified":"2026-09-23T11:38:54","modified_gmt":"2026-09-23T09:38:54","slug":"optical-failure-isolation","status":"publish","type":"page","link":"https:\/\/sector-technologies.com\/index.php\/optical-failure-isolation\/","title":{"rendered":"Optical Failure Isolation"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"2792\" class=\"elementor elementor-2792\">\n\t\t\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-ca30211 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"ca30211\" data-element_type=\"section\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t\t\t<div class=\"elementor-background-overlay\"><\/div>\n\t\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-19aefba\" data-id=\"19aefba\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-fda5790 elementor-widget elementor-widget-image\" data-id=\"fda5790\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img fetchpriority=\"high\" decoding=\"async\" width=\"495\" height=\"461\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/Meridian-application-2.png\" class=\"attachment-large size-large wp-image-1561\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/Meridian-application-2.png 495w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/Meridian-application-2-300x279.png 300w\" sizes=\"(max-width: 495px) 100vw, 495px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-db63ba1\" data-id=\"db63ba1\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-d9e8846 elementor-widget elementor-widget-heading\" data-id=\"d9e8846\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\"><p class=\"\" align=\"center\" style=\"text-align:left\"><b><u><span style=\"font-size:20.0pt;line-height:115%;color:#00000\">Optical Failure Isolation<\/span><\/u><\/b><\/p>\n\n<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-825a8c0 elementor-widget elementor-widget-text-editor\" data-id=\"825a8c0\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><strong>Static and Dynamic Failure Isolation for Advanced Semiconductor Devices<\/strong><\/p><p><strong>PCB, Package, Wafer and Die Analysis<\/strong><\/p><p><strong>Proven on technologies down to 7 nm<\/strong><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t<div class=\"elementor-element elementor-element-a8ea26a e-flex e-con-boxed e-con e-parent\" data-id=\"a8ea26a\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t<div class=\"elementor-element elementor-element-eb6394a e-con-full e-flex e-con e-child\" data-id=\"eb6394a\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-ccd2036 elementor-widget elementor-widget-text-editor\" data-id=\"ccd2036\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p style=\"text-align: left;\"><span style=\"font-family: Helvetica; font-size: 22px;\"><strong><span style=\"color: #4b2cff;\">Overview<\/span><\/strong><\/span><\/p><p>Rapid and accurate defect localization is essential for improving yield, accelerating product qualification, and ensuring the highest levels of product reliability. As semiconductor devices become increasingly complex, identifying electrical and physical failure mechanisms at microscopic scale has become a critical step in both development and manufacturing environments.<\/p><p>Sector Technologies provides advanced optical failure isolation solutions capable of localizing defects from PCB and package level down to individual transistors and interconnect structures. These technologies enable faster root cause analysis, reduced time to resolution, and improved manufacturing efficiency.<\/p><p><span style=\"font-family: Helvetica; font-size: 22px;\"><strong><span style=\"color: #4b2cff;\">Core Technologies<\/span><\/strong><\/span><\/p><p>Our portfolio combines the latest Thermo Fisher Scientific Electrical Failure Isolation (EFI) technologies, providing comprehensive solutions for defect localization across a wide range of applications.<\/p><p>From printed circuit boards and advanced packaging assemblies to full wafers and individual dies, our systems support failure analysis workflows throughout the entire semiconductor value chain.<\/p><p>Available technologies include:<\/p><ul><li>Lock-In Thermography (LIT)<\/li><li>RF Lock-In Thermography (RF-LIT)<\/li><li>Optical Beam Induced Resistance Change (OBIRCH)<\/li><li>Photon Emission Microscopy (EMMI)<\/li><li>Laser Scanning Microscopy (LSM)<\/li><li>Laser Voltage Imaging (LVI)<\/li><li>Laser Voltage Probing (LVP)<\/li><li>Laser Assisted Device Alteration (LADA)<\/li><\/ul><p>These solutions cover applications ranging from package-level fault localization to transistor-level defect identification.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-62bda12 e-con-full e-flex e-con e-child\" data-id=\"62bda12\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t<div class=\"elementor-element elementor-element-f5f942c e-con-full e-flex e-con e-child\" data-id=\"f5f942c\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-3f312a5 elementor-widget elementor-widget-image\" data-id=\"3f312a5\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" width=\"352\" height=\"318\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/ELITE-application-3.png\" class=\"attachment-large size-large wp-image-1545\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/ELITE-application-3.png 352w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/ELITE-application-3-300x271.png 300w\" sizes=\"(max-width: 352px) 100vw, 352px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-aece2b3 e-con-full e-flex e-con e-child\" data-id=\"aece2b3\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-5dc2de5 elementor-widget elementor-widget-image\" data-id=\"5dc2de5\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" width=\"420\" height=\"372\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/ELITE-application-2.png\" class=\"attachment-large size-large wp-image-1544\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/ELITE-application-2.png 420w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/ELITE-application-2-300x266.png 300w\" sizes=\"(max-width: 420px) 100vw, 420px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-3341a77 e-con-full e-flex e-con e-child\" data-id=\"3341a77\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-65b7c1d elementor-widget elementor-widget-image\" data-id=\"65b7c1d\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"530\" height=\"554\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/ELITE-application-1.png\" class=\"attachment-large size-large wp-image-1543\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/ELITE-application-1.png 530w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/02\/ELITE-application-1-287x300.png 287w\" sizes=\"(max-width: 530px) 100vw, 530px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-4952bfc e-flex e-con-boxed e-con e-parent\" data-id=\"4952bfc\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t<div class=\"elementor-element elementor-element-73152be e-con-full e-flex e-con e-child\" data-id=\"73152be\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-cec2579 elementor-widget elementor-widget-heading\" data-id=\"cec2579\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\"><p><b><span style=\"font-size:20.0pt;line-height:115%;color:#4b2cff\">Elite Family : Advanced Lock-in Thermography Solutions<\/span><\/b><\/p>\n\n<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-ff656fe elementor-widget elementor-widget-text-editor\" data-id=\"ff656fe\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>The rapid adoption of 2.5D and 3D packaging technologies, increasingly complex interconnect architectures, and next-generation power devices has introduced significant challenges for failure analysis laboratories.<\/p><p>Defects often manifest themselves through localized power dissipation anomalies that generate subtle thermal signatures. Detecting and interpreting these signatures quickly is essential for accurate root cause identification.<\/p><p>The Thermo Fisher ELITE platform provides highly sensitive, non-destructive fault localization through state-of-the-art infrared lock-in thermography. Patented noise-reduction technologies deliver exceptional thermal sensitivity, while integration with high-resolution laser scanning microscopy enhances defect localization accuracy.<\/p><p>For power electronics applications, the ELITE VX platform extends capability to devices operating at voltages up to 10 kV.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-085cbda e-con-full e-flex e-con e-child\" data-id=\"085cbda\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-905fd7d e-con-full e-flex e-con e-child\" data-id=\"905fd7d\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-925fc9e elementor-widget__width-initial elementor-widget elementor-widget-image\" data-id=\"925fc9e\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"109\" height=\"231\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/09\/EliteLite2.png\" class=\"attachment-large size-large wp-image-973\" alt=\"\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-a7d74ca elementor-widget elementor-widget-text-editor\" data-id=\"a7d74ca\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p style=\"text-align: center;\"><span style=\"color: #3366ff;\"><strong>Elite Lite<\/strong><\/span><\/p><ul><li>Localization of shorts, leakage paths and open circuits in modules and packages<\/li><li>Lock-In Thermography (LIT)<\/li><li>Optional Absolute Temperature Mapping<\/li><li>Optional 3D defect localization<\/li><\/ul><p><span style=\"text-decoration: underline;\"><a href=\"https:\/\/www.thermofisher.com\/es\/es\/home\/electron-microscopy\/products\/electrical-failure-analysis-systems\/elite.html\" target=\"_blank\" rel=\"noopener\">Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-381fa73 e-con-full e-flex e-con e-child\" data-id=\"381fa73\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-18433b1 elementor-widget__width-initial elementor-widget elementor-widget-image\" data-id=\"18433b1\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"113\" height=\"216\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/09\/Elite-VX.png\" class=\"attachment-large size-large wp-image-972\" alt=\"\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-99f69b8 elementor-widget elementor-widget-text-editor\" data-id=\"99f69b8\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p style=\"text-align: center;\"><strong style=\"color: #3366ff;\">Elite VX and DX<\/strong><\/p><ul><li>Localization of shorts, leakage paths and open circuits in packages and silicon devices<\/li><li>Lock-In Thermography (LIT)<\/li><li>Laser Scanning Microscopy (LSM)<\/li><li>OBIRCH analysis<\/li><li>VX configuration available for high-voltage power devices up to 10 kV<\/li><li>Optional laser marking<\/li><li>Optional flexible probing<\/li><li>Optional Absolute Temperature Mapping<\/li><\/ul><p><span style=\"text-decoration: underline;\"><a href=\"https:\/\/www.thermofisher.com\/es\/es\/home\/electron-microscopy\/products\/electrical-failure-analysis-systems\/elite\/techniques.html\" target=\"_blank\" rel=\"noopener\">Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-ad6c7c3 e-con-full e-flex e-con e-child\" data-id=\"ad6c7c3\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-557cae7 elementor-widget__width-initial elementor-widget elementor-widget-image\" data-id=\"557cae7\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"118\" height=\"187\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/ELITE300.jpg\" class=\"attachment-large size-large wp-image-2991\" alt=\"\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-92384e6 elementor-widget elementor-widget-text-editor\" data-id=\"92384e6\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p style=\"text-align: center;\"><span style=\"color: #3366ff;\"><strong>Elite 300<\/strong><\/span><\/p><ul><li>Failure localization on 300 mm wafers, packages and dies<\/li><li>Lock-In Thermography (LIT)<\/li><li>Laser Scanning Microscopy (LSM)<\/li><li>OBIRCH analysis<\/li><li>Optional laser marking<\/li><li>Optional flexible probing<\/li><li>Optional Absolute Temperature Mapping<\/li><\/ul><p><span style=\"text-decoration: underline;\"><a href=\"https:\/\/www.thermofisher.com\/es\/es\/home\/electron-microscopy\/products\/electrical-failure-analysis-systems\/elite\/applications.html\" target=\"_blank\" rel=\"noopener\">Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-72728e9 e-flex e-con-boxed e-con e-parent\" data-id=\"72728e9\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t<div class=\"elementor-element elementor-element-465b44c e-con-full e-flex e-con e-child\" data-id=\"465b44c\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-0620946 elementor-widget elementor-widget-heading\" data-id=\"0620946\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\"><p><b><span style=\"font-size:20.0pt;line-height:115%;color:#4b2cff\">Meridian Family : Photon Emission and Laser Scanning Microscopy Solutions<\/span><\/b><\/p>\n\n<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-2e7f93d elementor-widget elementor-widget-text-editor\" data-id=\"2e7f93d\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>The Thermo Fisher Meridian product family is designed for advanced photon emission microscopy and laser scanning microscopy analysis. The systems support static bias stimulation through probe cards or micro-probing platforms and deliver industry-leading sensitivity for electrical fault localization.<\/p><p><strong>Meridian S<\/strong><\/p><p>The Meridian S platform provides a cost-effective solution for routine failure analysis applications. It offers multiple photon emission detection options, dual-side probing capability, and a scalable upgrade path toward advanced dynamic fault isolation techniques.<\/p><p>Typical applications include:<\/p><ul><li>Process monitoring<\/li><li>Design validation<\/li><li>Customer return analysis<\/li><li>Root cause investigation of random electrical failures<\/li><\/ul><p><strong>Meridian 4<\/strong><\/p><p>The Meridian IV platform addresses the requirements of advanced semiconductor technologies where low-voltage operation, high circuit density, and complex failure mechanisms demand enhanced diagnostic capability.<\/p><p><strong>Meridian WaferScan<\/strong><\/p><p>Time-to-yield is a critical metric for both foundries and integrated device manufacturers. Waiting until dicing and packaging before identifying electrical defects significantly increases development costs.<\/p><p>The Meridian WaferScan platform enables defect localization directly on production wafers using standard test infrastructure, including probe cards, load boards, and automatic test equipment.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-619cfa2 e-con-full e-flex e-con e-child\" data-id=\"619cfa2\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-29456e6 e-con-full e-flex e-con e-child\" data-id=\"29456e6\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-e204656 elementor-widget__width-initial elementor-widget elementor-widget-image\" data-id=\"e204656\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"690\" height=\"593\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/MeridianS.png\" class=\"attachment-large size-large wp-image-670\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/MeridianS.png 690w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/MeridianS-300x258.png 300w\" sizes=\"(max-width: 690px) 100vw, 690px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-8c0719e elementor-widget elementor-widget-text-editor\" data-id=\"8c0719e\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p style=\"text-align: center;\"><span style=\"color: #3366ff;\"><strong>Meridian S<\/strong><\/span><\/p><p><strong>Key Capabilities<\/strong><\/p><ul><li>Localization of shorts, leakage paths and open circuits on silicon dies and wafer fragments<\/li><li>Static Photon Emission Microscopy<\/li><li>OBIRCH analysis<\/li><li>Solid Immersion Lens (SIL) technology<\/li><\/ul><p><strong>Available Options<\/strong><\/p><ul><li>High-voltage configuration for SiC and GaN devices<\/li><li>Enhanced EMMI and OBIRCH performance<\/li><li>Laser marking<\/li><li>CAD navigation and connectivity<\/li><\/ul><p><span style=\"text-decoration: underline;\"><a href=\"https:\/\/www.thermofisher.com\/es\/es\/home\/electron-microscopy\/products\/electrical-failure-analysis-systems\/meridian-s.html\" target=\"_blank\" rel=\"noopener\">Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-fd2ebf6 e-con-full e-flex e-con e-child\" data-id=\"fd2ebf6\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-6423e4f elementor-widget__width-initial elementor-widget elementor-widget-image\" data-id=\"6423e4f\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"455\" height=\"390\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/Meridian-IV.jpg\" class=\"attachment-large size-large wp-image-669\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/Meridian-IV.jpg 455w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/Meridian-IV-300x257.jpg 300w\" sizes=\"(max-width: 455px) 100vw, 455px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-3b75f0b elementor-widget elementor-widget-text-editor\" data-id=\"3b75f0b\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p style=\"text-align: center;\"><strong style=\"color: #3366ff;\">Meridian 4<\/strong><\/p><p><strong>Key Capabilities<\/strong><\/p><ul><li>Photon Emission Microscopy (EMMI)<\/li><li>OBIRCH<\/li><li>LADA<\/li><li>Laser Voltage Imaging (LVI)<\/li><li>Laser Voltage Probing (LVP)<\/li><li>Solid Immersion Lens technology<\/li><\/ul><p><strong>Available Options<\/strong><\/p><ul><li>Time-Resolved LADA<\/li><li>Advanced CAD integration<\/li><\/ul><p><span style=\"text-decoration: underline;\"><a href=\"https:\/\/www.thermofisher.com\/es\/es\/home\/electron-microscopy\/products\/electrical-failure-analysis-systems\/meridian-iv.html\" target=\"_blank\" rel=\"noopener\">Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-7266761 e-con-full e-flex e-con e-child\" data-id=\"7266761\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t<div class=\"elementor-element elementor-element-04fc139 elementor-widget__width-initial elementor-widget elementor-widget-image\" data-id=\"04fc139\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"622\" height=\"431\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/Waferscan.jpg\" class=\"attachment-large size-large wp-image-675\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/Waferscan.jpg 622w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2022\/07\/Waferscan-300x208.jpg 300w\" sizes=\"(max-width: 622px) 100vw, 622px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-8cb09bd elementor-widget elementor-widget-text-editor\" data-id=\"8cb09bd\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p style=\"text-align: center;\"><span style=\"color: #3366ff;\"><strong>Meridian Waferscan<\/strong><\/span><\/p><p><strong>Key Capabilities<\/strong><\/p><ul><li>Inspection of full 200 mm and 300 mm wafers<\/li><li>Photon Emission Microscopy (EMMI)<\/li><li>OBIRCH<\/li><li>LADA<\/li><li>Laser Voltage Imaging and Probing<\/li><li>Solid Immersion Lens technology<\/li><li>Automated probe-to-pad alignment<\/li><li>Automated die-to-die navigation<\/li><\/ul><p><strong>Available Options<\/strong><\/p><ul><li>Time-Resolved LADA<\/li><li>Advanced CAD connectivity<\/li><\/ul><p><span style=\"text-decoration: underline;\"><a href=\"https:\/\/www.thermofisher.com\/es\/es\/home\/electron-microscopy\/products\/electrical-failure-analysis-systems\/meridian-ws-dp.html\" target=\"_blank\" rel=\"noopener\">Datasheet<\/a><\/span><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-ebc8f13 e-flex e-con-boxed e-con e-parent\" data-id=\"ebc8f13\" data-element_type=\"container\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t<div class=\"elementor-element elementor-element-aa146d6 e-con-full e-flex e-con e-child\" data-id=\"aa146d6\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-281e8a7 e-con-full e-flex e-con e-child\" data-id=\"281e8a7\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-5ee04fb elementor-widget elementor-widget-heading\" data-id=\"5ee04fb\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\"><p class=\"MsoNormal\"><b><span style=\"font-size:20.0pt;line-height:115%;color:#4b2cff\">Applications<\/span><\/b><span style=\"font-family: inherit;font-size: 2rem\"><\/span><\/p><\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-2194ff4 e-con-full e-flex e-con e-child\" data-id=\"2194ff4\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-e2447b3 e-flex e-con-boxed e-con e-child\" data-id=\"e2447b3\" data-element_type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-df427e3 elementor-widget elementor-widget-image\" data-id=\"df427e3\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"581\" height=\"683\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/Picture13.png\" class=\"attachment-large size-large wp-image-3027\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/Picture13.png 581w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/Picture13-255x300.png 255w\" sizes=\"(max-width: 581px) 100vw, 581px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-c64635e e-con-full e-flex e-con e-child\" data-id=\"c64635e\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-1dafde7 elementor-widget elementor-widget-text-editor\" data-id=\"1dafde7\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><span style=\"color: #3366ff;\"><strong>PCB and package level Failure Isolation<\/strong><\/span><\/p><ul><li>Lock-In Thermography for short-circuit and leakage detection<\/li><li>RF-LIT for open-circuit detection<\/li><li>Inspection from large-format assemblies down to micrometer-scale defect localization<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-b97b793 e-con-full e-flex e-con e-child\" data-id=\"b97b793\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-4dff936 e-con-full e-flex e-con e-child\" data-id=\"4dff936\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-6eadd6c e-con-full e-flex e-con e-child\" data-id=\"6eadd6c\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-1a12ae0 elementor-widget elementor-widget-image\" data-id=\"1a12ae0\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"396\" height=\"445\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/Picture8.jpg\" class=\"attachment-large size-large wp-image-3022\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/Picture8.jpg 396w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/Picture8-267x300.jpg 267w\" sizes=\"(max-width: 396px) 100vw, 396px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-241adf0 e-con-full e-flex e-con e-child\" data-id=\"241adf0\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-566d129 elementor-widget elementor-widget-text-editor\" data-id=\"566d129\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><span style=\"color: #3366ff;\"><strong>Power Electronics Failure Analysis<\/strong><\/span><\/p><ul><li>Certified high-voltage solutions supporting applications up to 10 kV<\/li><li>Compatible with LIT, OBIRCH and Photon Emission techniques<\/li><li>Optimized for SiC and GaN technologies<\/li><\/ul><p>\u00a0<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-98a6109 e-con-full e-flex e-con e-child\" data-id=\"98a6109\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-2d1a124 e-con-full e-flex e-con e-child\" data-id=\"2d1a124\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-d18ea37 e-con-full e-flex e-con e-child\" data-id=\"d18ea37\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-652b074 elementor-widget elementor-widget-image\" data-id=\"652b074\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"181\" height=\"194\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/Picture9.png\" class=\"attachment-large size-large wp-image-3021\" alt=\"\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-4fad9fb e-con-full e-flex e-con e-child\" data-id=\"4fad9fb\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-a0da3d6 elementor-widget elementor-widget-text-editor\" data-id=\"a0da3d6\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><span style=\"color: #3366ff;\"><strong>Silicon Level Static Failure Isolation<\/strong><\/span><\/p><ul><li>Best-in-class sensitivity for static Photon Emission and OBIRCH analysis<\/li><li>Inverted architecture enabling backside investigation of packaged devices and wafer fragments<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-7005afd e-con-full e-flex e-con e-child\" data-id=\"7005afd\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-49e8994 e-con-full e-flex e-con e-child\" data-id=\"49e8994\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-81c1035 e-con-full e-flex e-con e-child\" data-id=\"81c1035\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-ebc8d2a elementor-widget elementor-widget-image\" data-id=\"ebc8d2a\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"408\" height=\"445\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/Picture10.jpg\" class=\"attachment-large size-large wp-image-3024\" alt=\"\" srcset=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/Picture10.jpg 408w, https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/Picture10-275x300.jpg 275w\" sizes=\"(max-width: 408px) 100vw, 408px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-b3567bd e-con-full e-flex e-con e-child\" data-id=\"b3567bd\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-5679331 elementor-widget elementor-widget-text-editor\" data-id=\"5679331\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><span style=\"color: #3366ff;\"><strong>Silicon Level Dynamic Failure Isolation<\/strong><\/span><\/p><ul><li>Laser Voltage Imaging and Probing for transistor-level diagnostics<\/li><li>Dynamic laser stimulation techniques including LADA<\/li><li>High-sensitivity dynamic Photon Emission analysis<\/li><li>Compatibility with emulation and ATE-based workflows<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-b79fe32 e-con-full e-flex e-con e-child\" data-id=\"b79fe32\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-7329774 e-con-full e-flex e-con e-child\" data-id=\"7329774\" data-element_type=\"container\">\n\t\t<div class=\"elementor-element elementor-element-72da215 e-con-full e-flex e-con e-child\" data-id=\"72da215\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-bedc234 elementor-widget elementor-widget-image\" data-id=\"bedc234\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img loading=\"lazy\" decoding=\"async\" width=\"196\" height=\"194\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/2026\/09\/Picture11.png\" class=\"attachment-large size-large wp-image-3023\" alt=\"\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t<div class=\"elementor-element elementor-element-b01dc9c e-con-full e-flex e-con e-child\" data-id=\"b01dc9c\" data-element_type=\"container\">\n\t\t\t\t<div class=\"elementor-element elementor-element-640e8fd elementor-widget elementor-widget-text-editor\" data-id=\"640e8fd\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><span style=\"color: #3366ff;\"><strong>Wafer level Failure Isolation for Yield improvement<\/strong><\/span><\/p><ul><li>Rapid localization of manufacturing defects directly on production wafers<\/li><li>Static Photon Emission and OBIRCH analysis with best-in-class sensitivity<\/li><li>LVx capabilities for scan-chain debug<\/li><li>Backside analysis on full 300 mm wafers<\/li><li>Compatible with both cantilever and vertical probe card architectures<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Optical Failure Isolation Static and Dynamic Failure Isolation for Advanced Semiconductor Devices PCB, Package, Wafer and Die Analysis Proven on technologies down to 7 nm Overview Rapid and accurate defect localization is essential for improving yield, accelerating product qualification, and ensuring the highest levels of product reliability. As semiconductor devices become increasingly complex, identifying electrical [&hellip;]<\/p>\n","protected":false},"author":4,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-2792","page","type-page","status-publish","hentry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v18.2.1 (Yoast SEO v26.6) - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Optical Failure Isolation - Sector-Technologies<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/sector-technologies.com\/index.php\/optical-failure-isolation\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Optical Failure Isolation\" \/>\n<meta property=\"og:description\" content=\"Optical Failure Isolation Static and Dynamic Failure Isolation for Advanced Semiconductor Devices PCB, Package, Wafer and Die Analysis Proven on technologies down to 7 nm Overview Rapid and accurate defect localization is essential for improving yield, accelerating product qualification, and ensuring the highest levels of product reliability. 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