{"id":213,"date":"2022-07-07T15:09:36","date_gmt":"2022-07-07T13:09:36","guid":{"rendered":"http:\/\/sector-technologies.odiss.fr\/ma447975-ovh\/?page_id=213"},"modified":"2022-07-08T14:46:40","modified_gmt":"2022-07-08T12:46:40","slug":"tester-for-design","status":"publish","type":"page","link":"https:\/\/sector-technologies.com\/index.php\/tester-for-design\/","title":{"rendered":"Tester for Design"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"213\" class=\"elementor elementor-213\">\n\t\t\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-8d2d8c4 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"8d2d8c4\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-33 elementor-top-column elementor-element elementor-element-3a6ae5e\" data-id=\"3a6ae5e\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-146cb73 elementor-widget elementor-widget-image\" data-id=\"146cb73\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/elementor\/thumbs\/Teseda_solution-flow-prp9iiae4pps883sv89aww35ga2rbnxozge09hq8xq.png\" title=\"Teseda_solution flow\" alt=\"Teseda_solution flow\" loading=\"lazy\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-66 elementor-top-column elementor-element elementor-element-0776956\" data-id=\"0776956\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-d61b9ae elementor-widget elementor-widget-text-editor\" data-id=\"d61b9ae\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<h1 style=\"background-image: initial; background-position: initial; background-size: initial; background-repeat: initial; background-attachment: initial; background-origin: initial; background-clip: initial; border: 0px; font-family: Helvetica, Arial, sans-serif; font-size: 23.4px; font-weight: bold; margin: 2em 0px 1em; padding: 0px; outline: 0px; color: #555555;\"><strong>Tester for design debug on silicon<\/strong><\/h1><p style=\"margin-top: 10px; margin-bottom: 10px; color: #555555; font-family: Helvetica, Arial, sans-serif; font-size: 13px; text-decoration-line: underline;\">Leveraging your\u00a0DFT<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-b4f2319 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"b4f2319\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-d78847b\" data-id=\"d78847b\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-53fc71c elementor-widget elementor-widget-text-editor\" data-id=\"53fc71c\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p style=\"margin-top: 10px; margin-bottom: 10px; color: #555555; font-family: Helvetica, Arial, sans-serif; font-size: 13px;\"><strong>Supporting designer along standard silicon validation<\/strong><\/p><p style=\"margin-top: 10px; margin-bottom: 10px; color: #555555; font-family: Helvetica, Arial, sans-serif; font-size: 13px;\">Designer are used to debug through simulation, first from\u00a0<a style=\"background-image: initial; background-position: initial; background-size: initial; background-repeat: initial; background-attachment: initial; background-origin: initial; background-clip: initial; border-width: 0px 0px 1px; border-image: initial; font-family: inherit; font-style: inherit; font-weight: bold; margin: 0px; padding: 0px; outline: 0px; color: #34647f; cursor: help; border-color: initial initial #000000 initial; border-style: initial initial dotted initial;\" title=\" Register Transfer Level (RTL) is a level of abstraction used in describing the operation of a synchronous digital circuit. In RTL design, a circuit's behavior is defined in terms of the flow of signals (or transfer of data) between hardware registers, and the logical operations performed on those signals.\u00a0 \">RTL<\/a>\u00a0level (Register Transfer Level), than functional and than at gate leval, however, the next level, debugging on silicon is more challenging: introducing new complexities &amp; time delays.<\/p><p style=\"margin-top: 10px; margin-bottom: 10px; color: #555555; font-family: Helvetica, Arial, sans-serif; font-size: 13px;\">Standard testing on silicon is using DFT &amp; scan chains to support testability of their design. However production testing is mainly\u00a0 offering \u00ab\u00a0go\/no go\u00a0\u00bb feedback. Practically, challenges for debugging on silicon are about :<\/p><ul style=\"background-color: #ffffff; font-family: Helvetica, Arial, sans-serif; font-size: 13px; margin: 1em; padding: 0px; color: #555555;\"><li style=\"font-family: inherit; font-size: 13px; font-style: inherit; font-weight: inherit; margin-top: 10px; margin-right: 0px; margin-left: 20px; padding: 0px; list-style: url('..\/images\/puce.png') circle;\">Time to debug: When introducing silicon, manufacturing floor introduce delays \u2013 outsourcing test means design may start new project, while waiting being able to debug first one.<\/li><li style=\"font-family: inherit; font-size: 13px; font-style: inherit; font-weight: inherit; margin-top: 10px; margin-right: 0px; margin-left: 20px; padding: 0px; list-style: url('..\/images\/puce.png') circle;\">Complexity to debug: Designer are using EDA tools for\u00a0<strong>A<\/strong>utomatic\u00a0<strong>T<\/strong>est\u00a0<strong>P<\/strong>attern\u00a0<strong>G<\/strong>eneration (<a style=\"background-image: initial; background-position: initial; background-size: initial; background-repeat: initial; background-attachment: initial; background-origin: initial; background-clip: initial; border-width: 0px 0px 1px; border-image: initial; font-family: inherit; font-style: inherit; font-weight: bold; margin: 0px; padding: 0px; outline: 0px; color: #34647f; cursor: help; border-color: initial initial #000000 initial; border-style: initial initial dotted initial;\" title=\" ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method\/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables testers to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.\u00a0 \">\u00a0ATPG<\/a>). Production test program translate pattern into their own language, introducing tool specificity. Complexity in translating back the test result for debugging.<\/li><li style=\"font-family: inherit; font-size: 13px; font-style: inherit; font-weight: inherit; margin-top: 10px; margin-right: 0px; margin-left: 20px; padding: 0px; list-style: url('..\/images\/puce.png') circle;\">Working around production Limitation: Test floor is focused in test application time, not debugging capabilities: limiting output to \u201cgo\/no go\u201d, thus debug capabilities<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-0ee58ef elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"0ee58ef\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-45aad63\" data-id=\"45aad63\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-0f020f4 elementor-widget elementor-widget-text-editor\" data-id=\"0f020f4\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p style=\"margin-top: 10px; margin-bottom: 10px; color: #555555; font-family: Helvetica, Arial, sans-serif; font-size: 13px;\"><strong>Speeding up silicon validation &amp; easing interpretation for designer with decicate solution<br \/><\/strong><\/p><p style=\"margin-top: 10px; margin-bottom: 10px; color: #555555; font-family: Helvetica, Arial, sans-serif; font-size: 13px;\">Having a tester \u2013 specialized in debugging, accessible to designer\/ product engineer.\u00a0 Than, Scan chains can also be naturally used to \u00ab\u00a0debug\u00a0\u00bb chip designs on silicon.<\/p><p style=\"margin-top: 10px; margin-bottom: 10px; color: #555555; font-family: Helvetica, Arial, sans-serif; font-size: 13px;\">Teseda is offering this unique tester solution focused for design debug on silicon.<\/p><ul style=\"background-color: #ffffff; font-family: Helvetica, Arial, sans-serif; font-size: 13px; margin: 1em; padding: 0px; color: #555555;\"><li style=\"font-family: inherit; font-size: 13px; font-style: inherit; font-weight: inherit; margin-top: 10px; margin-right: 0px; margin-left: 20px; padding: 0px; list-style: url('..\/images\/puce.png') circle;\">Accessible to designer\/ product engineer, it speed-up access to the test capability<\/li><li style=\"font-family: inherit; font-size: 13px; font-style: inherit; font-weight: inherit; margin-top: 10px; margin-right: 0px; margin-left: 20px; padding: 0px; list-style: url('..\/images\/puce.png') circle;\">Using\u00a0<a style=\"background-image: initial; background-position: initial; background-size: initial; background-repeat: initial; background-attachment: initial; background-origin: initial; background-clip: initial; border-width: 0px 0px 1px; border-image: initial; font-family: inherit; font-style: inherit; font-weight: bold; margin: 0px; padding: 0px; outline: 0px; color: #34647f; cursor: help; border-color: initial initial #000000 initial; border-style: initial initial dotted initial;\" title=\" Standard Test Interface Language (STIL)- is for universal pattern interchange from test generation tools (ATPG) output to tester input.\u00a0 \">STIL<\/a>\u00a0language, it simplifies analysis, with design centric test result<\/li><li style=\"font-family: inherit; font-size: 13px; font-style: inherit; font-weight: inherit; margin-top: 10px; margin-right: 0px; margin-left: 20px; padding: 0px; list-style: url('..\/images\/puce.png') circle;\">Thanks to optimize memory, it enables efficient failure coverage, providing the required information for debugging<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-7cc1493 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"7cc1493\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-33 elementor-top-column elementor-element elementor-element-993b8fd\" data-id=\"993b8fd\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-e206331 elementor-widget elementor-widget-image\" data-id=\"e206331\" data-element_type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" src=\"https:\/\/sector-technologies.com\/wp-content\/uploads\/elementor\/thumbs\/teseda_hardward-prp9iiaab0c81ujtmfl2i4cpkbr9f2dacs45y9oq82.jpg\" title=\"teseda_hardward\" alt=\"teseda_hardward\" loading=\"lazy\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-66 elementor-top-column elementor-element elementor-element-5ff58b7\" data-id=\"5ff58b7\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-a8263ba elementor-widget elementor-widget-text-editor\" data-id=\"a8263ba\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<h3>Check for\u00a0<a title=\"Teseda's testers\" href=\"https:\/\/sector-technologies.com\/products\/teseda-testers.html\" target=\"_blank\" rel=\"noopener\">Teseda&rsquo;s testers<\/a>\u00a0solution&#8230;<\/h3>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-6d9164b elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"6d9164b\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-9bc58eb\" data-id=\"9bc58eb\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-bccd993 elementor-widget elementor-widget-text-editor\" data-id=\"bccd993\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><strong>And beyond, a tool for Failure Analysis engineer.<\/strong><\/p><p>Beyond designer, across life cycle, product engineer &amp; failure analysis engineer need accessibility to the test capability.<\/p><p>Teseda is offering this unique tester solution capable supporting:<\/p><ul><li>Easier interaction with product engineer \/ designer when debugging with design centric test results<\/li><li>Unique flexibility to reproduce failure and apply stimulus to failure analysis tool (see our\u00a0<a title=\" Electrical Failure Analysis - part of the Global Fault Isolation - aiming to identify fault localization on chip from electrical simulation of the device\u00a0 \">EFA<\/a>\u00a0solutions)<\/li><\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Tester for design debug on silicon Leveraging your\u00a0DFT Supporting designer along standard silicon validation Designer are used to debug through simulation, first from\u00a0RTL\u00a0level (Register Transfer Level), than functional and than at gate leval, however, the next level, debugging on silicon is more challenging: introducing new complexities &amp; time delays. Standard testing on silicon is using [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-213","page","type-page","status-publish","hentry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO Premium plugin v18.2.1 (Yoast SEO v26.6) - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Tester for Design - Sector-Technologies<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/sector-technologies.com\/index.php\/tester-for-design\/\" \/>\n<meta property=\"og:locale\" content=\"fr_FR\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Tester for Design\" \/>\n<meta property=\"og:description\" content=\"Tester for design debug on silicon Leveraging your\u00a0DFT Supporting designer along standard silicon validation Designer are used to debug through simulation, first from\u00a0RTL\u00a0level (Register Transfer Level), than functional and than at gate leval, however, the next level, debugging on silicon is more challenging: introducing new complexities &amp; time delays. 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